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WO/2023/094587A1 |
The present invention is related to a remotely-controlled flying device intended to approach and contact a high-voltage overhead power line for operation thereon, said flying device comprising : - a mechanical structure (1) bearing a plu...
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WO/2023/092897A1 |
The present invention relates to a membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), probes (33), and a...
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WO/2023/092898A1 |
A membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), a probe (33) and an interconnection wire (34), wher...
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WO/2023/092899A1 |
A membrane probe card and a probe head thereof. The membrane probe card comprises a membrane probe head (3), the membrane probe head (3) comprising a support body (31), a membrane (32), a probe (33) and an interconnection wire (34), wher...
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WO/2023/092674A1 |
A testing device (100), comprising a testing table (10), a testing mechanism (20), a moving mechanism (30), and a limiting member (40). The testing table (10) is used for fixing a circuit board to be tested; the testing mechanism (20) is...
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WO/2023/090062A1 |
This probe storage jig stores a probe that includes an arm portion having a cantilever structure and a supporting portion connected to a fixed end of the arm portion. The probe storage jig has a configuration in which a first guide plate...
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WO/2023/090746A1 |
The present invention provides an electrically conductive contact pin and an inspection device having improved inspection reliability for an inspection object. The electrically conductive contact pin is characterized in that a first conn...
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WO/2023/090517A1 |
Disclosed are a system and a method therefor, the system enabling high-speed measurement of the performance of a plurality of measurement items for verification and post management of equipment under test including an antenna under test....
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WO/2023/089628A1 |
The present invention relates generally to Load Banks for testing generators and electric power sources and more particularly the present invention discloses a load bank system circuit topology and method thereof, to generate large numbe...
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WO/2023/090622A1 |
An electroluminescence inspection apparatus is disclosed. The electroluminescence inspection apparatus may comprise: a first substrate; a plurality of electrode members arranged on a first surface of the first substrate and having elasti...
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WO/2023/085661A1 |
The present invention provides a rubber socket for testing a semiconductor device, the rubber socket comprising: a main body having a plurality of conductive holes penetratively formed in a height direction and formed of an insulating fi...
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WO/2023/085502A1 |
An expansion member for a battery charging/discharging probe is disclosed. The expansion member comprises: a first fluid holding part forming a space in which fluid can be introduced and stored; and a fluid supply tube connected to the f...
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WO/2023/082712A1 |
A capacitor detection apparatus and method, and a motor control device. The detection apparatus comprises: a switch unit which is in a closed state when a motor control device needs to control a motor system to be powered on and started,...
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WO/2023/084888A1 |
Provided is a measurement probe with which, if a component is damaged or fails, that component alone can easily be replaced. The measurement probe comprises a cylindrical housing 8, at least one pin 1, an outer plunger 3 for holding th...
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WO/2023/083831A1 |
An electrical circuitry for detecting a fault current in an electric vehicle charging station. The electrical circuitry comprises a printed circuit board, comprising at least two conductive tracks for conducting electrical charging curre...
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WO/2023/084957A1 |
The present invention provides a silicon nitride composite material that stably has a thermal expansion coefficient and high strength equivalent to a silicon wafer, and a probe-guiding part. The silicon nitride composite material of the ...
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WO/2023/078923A1 |
The front-end circuit (1) for an impedance measurement comprises an excitation-terminal (12), intended to receive an excitation signal relative to a common ground (11), a first and a second input-terminal (13a,b), intended to be connecte...
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WO/2023/081635A1 |
A contactor assembly for a testing system for testing integrated circuit devices includes a contact, and a housing having a contact slot. The contact is receivable in the contact slot. The contact includes a tip, a body, and a tail; and ...
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WO/2023/077887A1 |
A power distribution network single-phase grounding fault arc self-extinguishing characteristic simulation apparatus and a test method. The simulation apparatus comprises a fuse (1), a circuit breaker (2), an arc striking apparatus (3), ...
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WO/2023/080534A1 |
A socket board for testing an ASIC chip of the present invention comprises: a chip connection unit having a predetermined conductive pattern and being electrically connected to an ASIC chip by means of contact between pins of the unspeci...
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WO/2023/080422A1 |
An electroluminescence inspection apparatus is disclosed. The disclosed electroluminescence inspection apparatus comprises: a first substrate; and a plurality of electrode members which are arranged on one surface of the first substrate ...
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WO/2023/080206A1 |
Provided is a pitch conversion unit for converting the pitch of a plurality of contact-terminal-side electrodes to the pitch of a plurality of device-side electrodes, the pitch conversion unit being configured such that the joining stren...
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WO/2023/080533A1 |
The present invention is to provide a test socket that has a minimum length suitable for the electrical testing of a semiconductor device and has stable stroke and excellent electrical characteristics. The test socket according to an emb...
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WO/2023/071738A1 |
An antenna test system, comprising: a dark chamber (1); a first bearing mechanism (2), wherein the first bearing mechanism (2) is arranged in the dark chamber (1); a conveying mechanism (3), wherein the conveying mechanism (3) is arrange...
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WO/2023/070652A1 |
A relay contact voltage drop test fixture, comprising a test base (15), a support (1), a mounting plate (3), an air cylinder (2), a buffering assembly and a test board (6), wherein a plurality of test columns (5) are mounted on the test ...
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WO/2023/074760A1 |
This anisotropic conductive sheet comprises: an insulation layer having an elastomer layer and a plurality of first heat-resistant resin layers disposed in a mutually separated manner on one side of the insulation layer; a plurality of t...
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WO/2023/074947A1 |
A cartridge locking apparatus for a multi-prober is provided. The present invention relates to an apparatus for locking a card assembly and a chuck assembly in a cartridge, which comprises the card assembly including a probe card with a ...
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WO/2023/075273A1 |
A disconnection testing apparatus for an electrode tab of a battery cell, according to the present invention, comprises: a measurement unit which measures impedance values and impedance angles according to the frequency of a battery cell...
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WO/2023/074942A1 |
A cartridge transport device for a multi-prober is provided. The present invention comprises: a first transport unit for moving a body frame in a Y axis direction parallel to the width direction of an inspection chamber by a first drivin...
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WO/2023/074198A1 |
Provided is a flexible substrate that does not easily break even if force is imparted to a portion thereof, and the like. The flexible substrate comprises one end, another end, and a pattern part 31a3 formed at least between the one en...
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WO/2023/069240A1 |
Probes that define retroreflectors, probe systems that include the probes, and methods of utilizing the probes. The probes include the retroreflector, which is defined by a retroreflector body. The retroreflector body includes a first si...
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WO/2023/069299A1 |
The probe assembly operates with a circuit board test apparatus and includes a main test probe and a secondary test probes. The probe assembly is capable of moving in X, Y and Z directions relative to a circuit board being tested (UUT). ...
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WO/2023/065067A1 |
The present disclosure provides a sampling assembly, a manufacturing method therefor, a battery and an electrical device. The sampling assembly is used in the battery. The battery comprises at least two battery bodies arranged along a fi...
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WO/2023/068708A1 |
The present invention relates to a test socket which can provide heat required to perform a burn-in test without separate additional equipment, the test socket comprising: a connection part (120); a frame (110) which supports the connect...
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WO/2023/061982A1 |
A test device (1) for singulated chips (4) having a test head (17) fitted with (test) needles (3) has contacts (10) which are arranged next to the test head (17). An arrangement for testing singulated chips (4) comprises a test device (1...
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WO/2023/060832A1 |
A device for measuring a demating value of a connector, the device comprising a first housing (100), a distance sensor (300) and a data transmission device, wherein the first housing (100) is arranged on the periphery of a joint of a con...
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WO/2023/059084A1 |
The present invention provides an electrically conductive contact pin and an inspection device having same, the contact pin applying frictional force to the sidewall of a guide hole so as to not to be dropped from a guide plate due to th...
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WO/2023/059014A1 |
The present invention provides an electrically conductive pin equipped with a moving tip portion of which at least a portion is inserted into a space part so as to be movable, wherein a head portion of the moving tip portion slides to a ...
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WO/2023/059013A1 |
The present invention provides: an electrically conductive contact pin which includes, at an end thereof, an elastic portion having an inner space passing therethrough in the thickness direction and is elastically deformed in the lateral...
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WO/2023/059078A1 |
The present invention provides an electro-conductive contact pin and an inspection apparatus comprising same, the electro-conductive contact pin being inserted in a hole of a support plate and installed in the support plate and comprisin...
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WO/2023/059130A1 |
The present invention provides an electrically conductive contact pin array in which the respective metal contents of a first electrically conductive contact pin, which provides external power or ground connection to a test object, and a...
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WO/2023/055688A1 |
A probe assembly includes a stepped insulator and a printed circuit board. The insulator is configured to surround a current carrying conductor. The printed circuit board includes a main portion and an outward protruding portion. The out...
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WO/2023/050082A1 |
Provided in the present application are a battery sampling chip and a battery management system. The battery sampling chip comprises: a selector module, which comprises a first data selector and a second data selector, wherein both the f...
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WO/2023/052482A1 |
The present invention relates to an active probe (1) for measuring a voltage across the terminals of a high-value impedance, said probe comprising: – an impedance-matching circuit (10) configured, on the one hand, to have an input impe...
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WO/2023/047618A1 |
In the present invention, a cylindrical member has a cylindrical shape having a center axis that extends in the vertical direction. A signal terminal holding member is positioned inside the cylindrical member at the lower part of the cyl...
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WO/2023/049433A1 |
A contact probe includes a shell having a first end and an opposed second end. The shell defines an interior chamber therein and a longitudinal axis extending through the first end and the second end. The contact probe further includes a...
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WO/2023/049432A1 |
A test socket for coupling an integrated circuit (IC) chip to a printed circuit board (PCB) is provided. The test socket includes a conductive body having a first surface configured to face the PCB and a second surface configured to face...
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WO/2023/049435A1 |
A test socket for a semiconductor integrated circuit (IC) is provided. The test socket includes a socket body configured to engage the semiconductor IC and a load board and an elastomer retainer including a top surface adjacent to the so...
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WO/2023/045349A1 |
Disclosed in the present invention is a multi-station rotary microprobe full-automatic edge curling machine, wherein a plurality of clamping tools are provided on a rotating table to form a feeding station, an edge curling station, and a...
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WO/2023/047962A1 |
The present invention provides a contact unit provided with a flexible substrate, and a block for pressing at least a part of the flexible substrate toward an object being inspected, wherein at least a part of the block has electrical co...
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