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WO/2021/082302A1 |
A test device, a test method, and a motherboard test device. The test device comprises: a controller configured to detect a user operation or detect a preset file to generate a control instruction; a driving device configured to generate...
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WO/2021/077589A1 |
A circuit (100) and an apparatus for measuring a pulse-per-second signal time difference, which are applicable to the technical field of time scale detection. The circuit (100) comprises a phase discrimination unit (11), a time voltage c...
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WO/2021/079277A1 |
The invention relates to a contacting device (3) for temporarily bringing a first cable portion (5) of a cable (20), in particular a first cable end, into electrical contact with a cable-testing device (10), the contacting device (3) com...
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WO/2021/075744A1 |
An impedance measurement device according to the present invention comprises: an electrochemical energy device; an amplification unit connected to each of connection terminals of the electrochemical energy device so as to amplify a signa...
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WO/2021/072603A1 |
Disclosed are an LED testing device and method. The LED testing device comprises: a testing circuit board (100); an elastic substrate (102), the elastic substrate (102) being arranged at the lower end of the testing circuit board (100), ...
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WO/2021/075455A1 |
This testing connector is connected to an end section of a coaxial wire section provided with a central conductor, an outer conductor that surrounds the periphery of the central conductor, and a first insulator that insulates the central...
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WO/2021/075628A1 |
The present invention relates to a bidirectional conductive module, comprising: an insulating body formed of an insulating material and having a plurality of conductive holes penetrated in the vertical direction; a plurality of conductiv...
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WO/2021/074362A1 |
The invention relates to a mounting system (1) for a contact pin (2) for contacting an electric/electronic test object, comprising a mounting sleeve (6) which can be secured to a contact head and which is designed to receive and hold the...
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WO/2021/069566A1 |
The invention concerns a measurement probe (6) for on-wafer testing of semiconductor devices, comprising a plurality of contact fingers at a distal end for contacting landing pads of the wafer. The measurement probe (6) comprises a centr...
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WO/2021/066357A1 |
A battery control device, according to one embodiment of the present invention, comprises: an inverter connected to a battery cell and configured to convert a DC current outputted from the battery cell into an AC current and output the A...
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WO/2021/067049A1 |
Probe systems for optically probing a device under test (DUT) and methods of operating the probe systems. The probe systems include a probing assembly that includes an optical probe that defines a probe tip and a distance sensor. The pro...
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WO/2021/065702A1 |
This probe is for inspecting characteristics of a connector and is provided with: a flange for attaching the probe to equipment; a housing which has a base end section and a distal end section, is inserted through a through-hole of the f...
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WO/2021/066255A1 |
A test socket of the present invention comprises: a plurality of spring contacts, each of which includes an upper contact pin, a lower contact pin, and a coil spring for elastically supporting the upper contact pin and the lower contact ...
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WO/2021/067011A1 |
An electrical measurement contacting system for use with a component testing system operable to convey devices includes: a first module including a test contact module having a test contact adapted to electrically contact devices conveye...
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WO/2021/064087A1 |
The invention relates to an assembly for checking the functionality of a measuring object, i.e., DUT, in the form of a medical implant or at least one part of a medical implant. The assembly comprises a test signal generator; a test modu...
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WO/2021/064788A1 |
This inspection jig (10) is used to inspect a device under inspection comprising a flexible board (17) in which an external connection terminal (19) is formed in a flexible substrate (18). The inspection jig (10) comprises an inspection ...
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WO/2021/062117A1 |
A reconfigurable optic probe is used to measure signals from a device under test. The reconfigurable optic probe is positioned at a target probe location within a cell of the device under test. The cell including a target net to be measu...
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WO/2021/060189A1 |
This probe (101) for measuring a connector is connected to a connector to be measured. A plurality of probe parts (10) each have an outer conductor (12) and central conductors (11A-11H) in contact with a signal terminal. A plunger (2) co...
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WO/2021/060727A1 |
The present invention relates to a foreign substance cleaning sheet for a test socket and, more specifically, to a foreign substance cleaning sheet for a test socket, the foreign substance cleaning sheet being used in a test socket in or...
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WO/2021/049237A1 |
Provided is an external spring-type contact probe in which the end of a coil spring can be can reliably abutted and a swaging portion can be formed easily. A plunger (16) comprises: a small-diameter portion provided in a midway position ...
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WO/2021/048388A1 |
Method for determining the voltage UL generated by the inductive portion (6) of a measuring resistor (2) present in an electronic circuit comprising a signal generator (1), at least one stator winding (3) that is connected to the signal ...
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WO/2021/048459A1 |
The invention relates mainly to a compact connection, sensing and measurement device for connecting to the electrical network via easy and quick connection thereof to any switchgear device, such as a thermal-magnetic or differential circ...
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WO/2021/045286A1 |
The present invention relates to a test socket having an empty space, the test socket comprising: a base sheet through which a plurality of first conductive holes are formed in the up and down directions; a plurality of insulating materi...
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WO/2021/045502A1 |
Disclosed is a test probe for testing a device to be tested. The test probe includes a line contact portion comprising a first contact line set and a second contact line set each comprising two contact lines linearly extending to be spac...
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WO/2021/039898A1 |
An inspection jig 2 comprises: film-shaped wiring substrates 21 - 23 in which electrodes E are disposed on one surface thereof; a base 7 which supports the wiring substrates 21 - 23 which are layered while exposing electrode regions A1 -...
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WO/2021/040451A1 |
The present invention relates to an inspection socket comprising: a plurality of conductive parts which are arranged, respectively, at positions corresponding to the terminals of a device to be inspected, and which have a plurality of co...
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WO/2021/041917A1 |
A temporary bond method and apparatus for allowing wafers, chips or chiplets. To be tested, the temporary bond method and apparatus comprising: a temporary connection apparatus having one of more knife-edged microstructures, wherein the ...
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WO/2021/033824A1 |
The present invention relates to a test socket with a replaceable portion, comprising: a first socket module comprising a first insulating main body made of an insulation material, and a plurality of first conductive patterns formed to b...
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WO/2021/032396A1 |
The present invention relates to a test method for an unpopulated printed circuit board, comprising the steps of: exposing the unpopulated printed circuit board to temperatures of a reflow soldering process in a first step; and testing t...
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WO/2021/027472A1 |
A high pressure accelerated aging test machine for finished chip test and a use method therefor. The test machine comprises an upper machine body (1), a pressure door (2) being movably mounted on a front surface of the upper machine body...
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WO/2021/023740A1 |
A probe head (20) adapted to verify the operation of a device to be tested integrated on a semiconductor wafer comprises at least one guide (40, 50) provided with a plurality of guide holes (40h, 50h) adapted to house a plurality of cont...
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WO/2021/023790A1 |
A mass connection system (1) for a test system has a receiving frame (10) and at least one support frame (30, 30', 30'', 30#). The receiving frame (10) has a plurality of recesses (12) which each completely penetrate the receiving frame ...
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WO/2021/023472A1 |
The invention relates to the protection of an AC device, in particular an inductive voltage converter (11), electrically connected to an AC line (5), from damage caused by direct currents flowing in the AC line (5). In this case, at leas...
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WO/2021/023739A1 |
The invention describes a probe head (21) for a test equipment of electronic devices comprising a plurality of contact probes (22) inserted in guide holes provided in at least one upper guide (23) and one lower guide (24), a bending area...
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WO/2021/017555A1 |
A waterproof housing for an oscilloscope, comprising an upper cover (1), a base (8), and an annular plastic sealing ring (3). A hollow screw thread sleeve (6) extends integrally upwards on an upper end surface of the base (8). The upper ...
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WO/2021/019399A1 |
It is disclosed a power supply system (50) comprising a power supply circuit (1), a sensor (3) of the current (I_HV+) flowing through a terminal of the power supply circuit and a protection circuit (2). The protection circuit comprises a...
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WO/2021/013674A1 |
The invention relates to a test card (1) for electrically testing electrical/electronic test objects (2), such as solar cells, wafers or circuit boards, comprising a contact head (11) having at least one retaining unit on which at least ...
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WO/2021/013249A1 |
A partial discharge detection sensor and a manufacturing method therefor. The partial discharge detection sensor comprises a first half-ring magnetic core member (1), and a second half-ring magnetic core member (2) disposed corresponding...
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WO/2021/013229A1 |
A testing circuit for a cascaded converter multi-submodule. A current generator (1) provides a testing current to a tested module group (2); the tested module group (2) comprises two tested bridge arms (201) consisting of multiple tested...
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WO/2021/015388A1 |
Disclosed are an overcurrent protection device and a power conversion device using same. A power conversion device according to an embodiment of the present invention comprises: a control unit for providing a collector-emitter voltage to...
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WO/2021/013318A1 |
The invention relates to an arrangement (1) for determining the magnitude of a current (IS) flowing through a busbar, having a measurement conductor (5) which is electrically connected to the busbar (3) at a first contact point (A) and e...
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WO/2021/010583A1 |
A technical idea of the present invention provides an interface which enables a test object to be tested reliably and quickly, an interface assembly and a test socket including same interface, and a method of manufacturing same interface...
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WO/2021/006609A1 |
Disclosed is a test device for testing electric characteristics of an object-to-be-tested. The test device includes: a test socket including a probe configured to transmit a test signal to the object-to-be-tested; and a pusher unit confi...
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WO/2021/006956A1 |
Systems for probing superconducting circuits, including using a non-magnetic cryogenic heater, are disclosed. A system including a circuit board having a socket and a heater, mounted on the socket, is provided. The heater includes a resi...
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WO/2021/005136A1 |
The present invention relates to a an anti-tamper device (11, 11') for a utility meter (1), in particular for an enclosure (2) thereof, providing a guideway (23, 23') for a sealing element (20), wherein in a sealed state (S) of the utili...
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WO/2021/002690A1 |
The present invention relates to a test socket used for measuring electrical properties of an electric element. The present invention provides a test socket disposed between opposing terminals to electrically connect the terminals, the t...
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WO/2021/002572A1 |
A probe block assembly for inspecting a display panel, according to the present invention, may comprise: a plurality of probe blocks being in contact with a plurality of electrode pads of a display panel so as to inspect whether there is...
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WO/2021/003486A1 |
A ratio metric (RM) approach to providing the current sensing function of service currents to smart metering applications results in an RM current sensor assembly and RM differential current sensor assembly that can replace prior art sen...
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WO/2020/259253A1 |
An analysis device for a detection chip, and an operation method and an analysis system thereof. The analysis device comprises a base and a control module. The control module comprises a positioning sub-module, an operation sub-module an...
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WO/2020/253552A1 |
Disclosed are a high-precision resistor measurement system and method based on the combination of a differential method and a proportional method. The system comprises: a constant-current source, a reference resistor, a first differentia...
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