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WO/2024/092370A1 |
Providing an X-ray measurement with a reduction in the measure of scattered photons is significantly advantageous over measurements with a usual contribution of scattered photons. Using a temporal point spread function (TPSF) of the dete...
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WO/2024/094008A1 |
A flat panel detector and a synchronous detection method using same. The flat panel detector comprises: a receiver board body (101) fixedly mounted on a movable fixation member; an energy receiving module (102) for receiving energy of el...
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WO/2024/097569A1 |
Methods and systems for evaluating individual semiconductor metrology tool productivity based on both individual tool productivity metrics and fleet productivity metrics are described herein. Productivity metrics associated with each ind...
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WO/2024/096405A1 |
The present invention relates to an XRD automatic analysis system that can automatically perform XRD analysis on multiple samples in order by using a transfer robot capable of supplying and discharging a sample into an XRD analyzer, and ...
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WO/2024/095551A1 |
In the present invention, the respective measured intensities of Compton and Rayleigh scattering lines (MC, MR) are extracted from the spectrum of a target sample in which a resin-containing thin film is formed on a base material (S21, S...
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WO/2024/093766A1 |
A single-electron-source X-ray tube (100), an X-ray tube assembly and a corresponding CT device. The X-ray tube (100) comprises a single electron source (3) and at least two anode target surfaces (1, 5), wherein the single electron sourc...
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WO/2024/097114A1 |
The disclosed inventions relate to an improved bioceramic coated product and methods of characterizing coated products. More specifically, the disclosed inventions relate to an improved bioceramic coated product comprising bioceramic par...
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WO/2023/100611A8 |
This X-ray fluorescence spectrometer comprises a calculation means (10) for calculating the content of an element in a sample (13) by an FP method, and, in order to take into account the effect of non-measured elements for which X-ray fl...
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WO/2024/088015A1 |
Provided in the present disclosure are a scanning imaging device and a scanning imaging method. The scanning imaging device comprises: a frame, which comprises a horizontal arm and a vertical arm; and a top backscatter module, which is m...
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WO/2024/090511A1 |
A prediction device 100 includes: an acquisition unit 111 that acquires blending ratio information related to the blending ratios of a plurality of materials contained in an object, and image information related to an image showing the s...
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WO/2024/088308A1 |
A method, device and system for determining the content of a proppant for fracturing. The method comprises: determining a quartz component S in a proppant (S101); determining a plurality of initial screening conditions (S102); mixing the...
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WO/2024/090411A1 |
The objective of the present invention is to provide an X-ray detector of an X-ray imaging system that can tolerate minute angular displacement of the X-ray detector, which employs an X-ray line sensor that is scanned. To this end, the X...
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WO/2024/089368A1 |
Disclosed is a WDS microprobe optimized for lithium detection in a sample, comprising an electron probe microanalyzer coupled to a WDS spectrometer. It comprises: a particular multi-layer pseudo-crystal having a spectral domain including...
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WO/2024/091829A1 |
A method of milling a diagonal cut in a region of a sample, the method comprising: positioning the sample in a processing chamber having a charged particle beam column; moving the region of the sample under a field of view of the charged...
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WO/2024/090412A1 |
The objective of the present invention is to provide an X-ray detector of an X-ray imaging system with which it is simple to obtain an X-ray transmission image having a desired resolution or detection sensitivity, for a case in which the...
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WO/2024/090806A1 |
The present invention relates to a method for evaluating a negative electrode active material for a lithium secondary battery and a negative electrode for a lithium secondary battery, comprising a negative electrode active material which...
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WO/2024/089386A1 |
A method has been recently developed to identify and/or assess structural integrity of a composite material, by distributing fiducial markers (which attenuate x-rays to an extent greater than the rest of the material) withing the composi...
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WO/2024/091702A1 |
The present invention comprises the provision and use of a new and improved method and apparatus for calibrating an imaging device and/or accounting for, and correcting for, nonlinearity encountered in the use of PCDs in X-ray scanning a...
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WO/2024/083789A1 |
The present invention provides a device (1) and a method for online x-ray fluorescence analysis of a chemical fluid from at least one chemical fluid bath (100). The device comprises a housing (2), a sample holder and an x-ray fluorescenc...
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WO/2024/086652A1 |
This disclosure relates generally to CT x-ray imaging systems and methods, and particularly to an inverse geometry with tetrahedron beams. Specifically, a dose efficient and controllable inverse geometry tetrahedron beam CT imaging is di...
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WO/2024/084470A1 |
A method of imaging a biological sample is disclosed, which comprises coupling at least one affinity probe to the biological sample, wherein the affinity probe includes a cleavable tag, bringing the probe-coupled biological sample into c...
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WO/2024/083342A1 |
The invention relates to an X-ray measurement arrangement (1) for examining test objects (20) by means of X-ray radiation, comprising a rotatable receiving device (2), an X-ray examination device (3) having at least one X-ray source (4) ...
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WO/2024/086838A1 |
When x-ray fluorescence ("XRF") spectroscopy is utilized to classify materials transported on a moving conveyor belt, there is the possibility of the x-ray beam only partially irradiating the material piece, which can result in the captu...
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WO/2024/082185A1 |
A measurement device for the package stress of a chip, and a measurement method. The measurement device for the package stress of a chip comprises a test table (1), a first XYZ-axis movement device (2) mounted on the test table (1), an X...
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WO/2024/086302A1 |
Provided herein are methods, apparatuses, computer program products, and systems for anomaly detection using machine learning models. One method can include obtaining X-ray computed tomography (CT) scan data for a scan object of a predet...
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WO/2024/081638A1 |
Disclosed herein include embodiments of a method of positioning (or leveling or moving) a sample (e.g., adjusting the tip-axis and the tilt axis of the sample or T nT motion stage). A sample can be provided. The sample can be in a sample...
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WO/2024/081125A1 |
A method of analyzing a lubricating oil may include: measuring a first concentration of components in a lubricating oil prior to introduction into a cylinder in a two-stroke engine using x-ray fluorescence, the components comprising: sul...
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WO/2024/081370A1 |
An x-ray scanner has a carriage with a front side, and a back side with a hemispherical cut-out opening sized to receive an open end of a pipe. The carriage also forms a housing that contains an x-ray generator, a computer that controls ...
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WO/2024/074173A1 |
The invention relates to the provision of a suitable interior for a near-atmospheric-pressure operating mode and a vacuum-pressure operating mode of an entrance portion of a material analysis system. The entrance portion comprises a hous...
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WO/2024/076861A2 |
A method for gain correcting a gamma ray spectrum includes acquiring a gamma ray spectrum including gamma ray counts distributed into a plurality of energy channels, evaluating the acquired gamma ray spectrum to determine an energy of a ...
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WO/2024/074964A1 |
Methods and systems include generating, from an electron beam generator, an electron beam in a vacuum chamber. A mounting platform in the vacuum chamber is configured to support a material. The electron beam is directed at a surface regi...
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WO/2024/075614A1 |
Provided is a carbon structure having a three-dimensional shape containing nano-carbon structures, wherein the nano-carbon structures have at least one structure from among a petal-like structure, in which flaky carbon having a graphene ...
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WO/2024/076848A2 |
A method for estimating net inelastic gamma ray counts includes acquiring a burst gamma ray count measured during a neutron burst time interval, acquiring a capture gamma ray count measured during at least one neutron capture time interv...
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WO/2024/066708A1 |
Provided are a calibration method and a calibration apparatus for an imaging device and an imaging device, which can be applied to the technical field of security checks and the field of medical diagnosis. The method comprises: calculati...
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WO/2024/070776A1 |
Provided are an image display device, an image display system, an image display method, an image processing device, and a program, wherein a characteristic of an object of investigation can be evaluated more easily. This image display de...
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WO/2024/072979A1 |
A method for producing high resolution computed tomography (CT) images is disclosed. The method includes combining multiple focal spots in a single data acquisition to provide high-resolution multi-resolution data that is able to resolve...
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WO/2024/071479A1 |
The present invention relates to an X-ray inspection device having a multi-point inspection structure. An X-ray device having a multi-point inspection structure includes: an induction rail (12) for the transfer of an inspection subject (...
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WO/2024/069107A1 |
The invention relates to a method for extracting discrete neutron components (derived from photonuclear reactions between photons and at least one chemical element to be detected) from a neutron spectrum derived from photonuclear reactio...
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WO/2024/069737A1 |
Provided is an inspection method for inspecting the electrical characteristics of a pattern on a sample where a pattern 102 comprising a conductor or a semiconductor has been formed in a dielectric region 101. A secondary electron image ...
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WO/2024/066108A1 |
An electro-optical test platform device, applicable to the technical field of electro-optical experiments. The device comprises: an electron gun (1), a vacuum chamber (2), a liner tube (4) and carrier disks (5); the electron gun (1) gene...
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WO/2024/070230A1 |
This X-ray phase imaging device (100) comprises: an X-ray light source (10), an X-ray detector (11), a plurality of lattices; a rotary mechanism (15) which rotates a subject (90) including fibers (91a) and the plurality of lattices relat...
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WO/2024/072642A1 |
A system may include a controller couplable to an imaging sub-system utilizing multiple particle beams, where the imaging sub-system includes one or more control elements to manipulate the two or more particle beams that are adjustable w...
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WO/2024/073302A1 |
A method for scanning a target object is provided. The method includes generating a scanning path including source poses at which a target object is scanned by a scanning source. The method also includes moving the target object along th...
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WO/2024/070777A1 |
The present invention provides an image display device, an image display system, an image display method, an image processing device, and a program that can facilitate easier evaluation of characteristics of inspection targets. Provided ...
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WO/2024/068810A1 |
The present disclosure relates to the field of radiation imaging for testing and/or quality assurance of items (6) in a variety of industrial applications. The radiation imaging system (1) for inspecting a plurality of items (6) comprise...
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WO/2024/073035A1 |
An imaging system that includes an imaging detector, an object region and a scintillator stack having a first scintillator and a second scintillator positioned between the imaging detector and the object region along an imaging pathway. ...
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WO/2024/064112A2 |
Magnetic particles capture a biological target molecule for cryo-electron microscope imaging. The magnetic particles include paramagnetic beads. At least two spacer modules extend from a periphery of the paramagnetic beads comprising a f...
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WO/2024/062429A1 |
A method for evaluating a sample, the method includes (a) illuminating a liquid metal jet alloyed with aluminum with an electron beam to provide a first x-ray beam; (b) spectral filtering, by a filtering unit, the first x-ray beam to pro...
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WO/2024/060658A1 |
A multi-functional sample chamber system applicable to an electron microscope, and a simulation method. A simulation structure of the multi-functional sample chamber system is arranged in a chamber of a scanning electron microscope, and ...
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WO/2024/061904A1 |
The present invention relates to a gripper unit (1) for gripping and transferring support structures, in particular electron microscopy grids. The gripper unit (1) includes gripper fingers (10) being configured for gripping and releasing...
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