CALIBRATION METHOD AND APPARATUS FOR IMAGING DEVICE AND IMAGING DEVICE

WIPO Patent Application WO/2024/066708

A1

Provided are a calibration method and a calibration apparatus for an imaging device and an imaging device, which can be applied to the technical field of security checks and the field of medical diagnosis. The method comprises: calculating a first theoretical intersection line according to a theoretical position of a target point of a radiation source of the imaging device, a theoretical detection position of a detector, and a phantom position of a calibration phantom (S210); determining first detection projection information for the calibration phantom on the basis of the first theoretical intersection line, an attenuation coefficient of rays emitted by the radiation source in the calibration phantom, and ray energy spectrum distribution of the radiation source in the imaging device (S220); and adjusting a parameter of the imaging device by using difference information between the first detection projection information and second detection projection information obtained by scanning the calibration phantom with the imaging device, so as to calibrate the imaging device to obtain a calibrated target parameter (S230).

ZHANG LI (CN)
CHEN ZHIQIANG (CN)
SUN YUNDA (CN)
LI XINBIN (CN)
SHEN LE (CN)
ZHAO ZHENHUA (CN)
YANG HONGKAI (CN)

PCT/CN2023/109291

April 04, 2024

July 26, 2023

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NUCTECH CO LTD (CN)
UNIV TSINGHUA (CN)

A61B6/03; G01N23/046; G01N23/087; G01T7/00

WO2021259339A1

2021-12-30

JP2019176988A	2019-10-17
CN111462267A	2020-07-28
CN106154306A	2016-11-23
CN106618620A	2017-05-10
CN113804709A	2021-12-17
CN114041811A	2022-02-15
US20160242726A1	2016-08-25

CHINA SCIENCE PATENT & TRADEMARK AGENT LTD. (CN)

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