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WO/2023/065671A1 |
A full-automatic detection system (100) and method. The full-automatic detection system (100) comprises: a first detection apparatus (101) used for performing physical scanning on an object to be detected; a second detection apparatus (1...
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WO/2023/068705A1 |
Provided are a variable detector in which the structural stability of the detector can be improved even with a change in shape, and an image photographing apparatus comprising same. The detector according to an embodiment of the present ...
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WO/2023/062568A1 |
The invention concerns a detector device (100) of radiation emitted by a sample (C) irradiated with an excitation beam (F). The detector device (100) comprises a hollow guide element (40) having an inlet opening (42) and an outlet openin...
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WO/2023/063703A1 |
Disclosed are a taxonomy system for facilitating space group reasoning and a taxonomy system construction method in connection therewith. A selected area diffraction pattern (SADP) taxonomy includes a plurality of labels, wherein the lab...
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WO/2023/063551A1 |
The present invention relates to a CT scan apparatus, and comprises: a CT scan unit that captures N projection images of a subject to be examined; and a CT image generation unit having an artificial intelligence-based AI model that recei...
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WO/2023/059493A1 |
This disclosure provides systems, methods, and apparatus related to electron microscopy sample preparation. In one aspect, a method includes providing an electron microscopy grid. An aqueous suspension including an electron microscopy sa...
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WO/2023/058456A1 |
The purpose of the present invention is to provide an inspection device that can determine the reliability of an image feature value in a target region of an observation image of a sample. This inspection device extracts a first feature ...
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WO/2023/057768A1 |
A shielded apparatus (101) comprising a device (103) and a shield (105), and a method of producing a shielded apparatus. The device (103) attenuates x-rays by different amounts in different parts of the device (103), providing a first sp...
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WO/2023/056939A1 |
The present disclosure relates to the technical field of detection apparatuses, and more particularly to a posture adjustment structure, a transmission device, and a radiation imaging system. The posture adjustment structure comprises: a...
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WO/2023/056882A1 |
An inspection device used for scanning and inspecting an object being inspected (2), comprising: an inspection channel (1), the object being inspected (2) entering and exiting the inspection device by means of the inspection channel (1);...
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WO/2023/058659A1 |
The purpose of the present invention is to provide: a new porous three-dimensional network structure applicable to a crystalline sponge method; a method for producing the porous three-dimensional network structure; and a new structural a...
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WO/2023/056940A1 |
A method for acquiring feature information of an object to be inspected (2), comprising: controlling said object (2) to pass through inspection equipment; controlling an imaging system (6) to perform radiation scanning on said object (2)...
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WO/2023/056506A1 |
The use of tin mono-chalcogenide nanosheets for the detection of X-rays; processes for the manufacture of said tin mono-chalcogenide nanosheets; detectors comprising said tin mono-chalcogenide nanosheets; as well as devices comprising ti...
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WO/2023/057520A1 |
A dual-beam device, such as, a scanning electron microscope combined with a focused-ion beam milling column, is employed for a slice-in-image process. Based on one or more images of at least one cross-section of a test volume of a wafer,...
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WO/2023/053768A1 |
Provided are an information processing device, an information processing method, and a program, whereby visibility of a detection object in an image can be improved, and display that can suppress oversight can be realized. An information...
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WO/2023/053838A1 |
Provided are a method for analyzing a photosensitive composition, a method for manufacturing a photosensitive composition, and a method for manufacturing an electronic device, with which it is possible for a trace amount of metal atoms c...
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WO/2023/052738A1 |
A method of scanning a chemical processing vessel and diagnosing a problem within the chemical processing vessel and/or a problem with a process occurring within the chemical processing vessel, the method comprising: scanning the chemica...
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WO/2023/055970A1 |
Some embodiments include an x-ray detector, comprising a housing; an sensor array disposed in the housing and configured to generate image data in response to incident x-rays; a control logic disposed in the housing; a connector interfac...
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WO/2023/053558A1 |
The present invention provides a plating defect estimation method capable of estimating the degree of generation of a spike caused by plating, prior to formation of a plating film, and a semiconductor device manufacturing method using th...
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WO/2023/053727A1 |
Provided are an image processing device, a processing system, an image display method, and a program whereby excellent visibility of defects in an object to be processed can be ensured. A processing target image (IMG) generated by photog...
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WO/2023/052755A1 |
It is disclosed a computer-implemented method of processing one or more inspection images comprising a plurality of pixels, comprising: obtaining an input inspection image (S1) generated by an inspection system configured to inspect one ...
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WO/2023/049957A1 |
A method for determining a spatial distribution of a radiation damage of a heterogenous material. The steps include some or all of the following. Representing a multiphase microstructure of the heterogenous material as a 2D or 3D image. ...
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WO/2023/053728A1 |
Provided are a display processing device, a display processing method, and a display processing program for displaying an image with which correlations between a plurality of detection target regions are easily confirmed. The display pro...
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WO/2023/047932A1 |
Since it takes seconds to minutes to obtain a single image, time-division observation of a sample cannot be performed for events on a time scale less than the time it takes to obtain the single image. The present invention comprises: a p...
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WO/2023/046527A1 |
Embodiments provide methods for water ingress determination in a ground overburden. A method comprises positioning a particle detector directed towards the ground overburden, and measuring a first flux of particles through the ground ove...
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WO/2023/048611A1 |
A charged particle spectrometer (100) is described, which comprises an imaging energy analyser (101) and an electrostatic lens system (102), having a first deflector (16A/16C, 16B/16D) and optionally a second deflector (17A/17C, 17B/17D)...
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WO/2023/047905A1 |
In an X-ray photoelectron spectrum obtained under the condition that incident X-ray energy is 250 eV and a photoelectron extraction angle is 45°, provided that the total spectrum area of Si 2p1/2 and Si 2ｐ3/2 spectra is 1, this SiC cr...
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WO/2023/044528A1 |
An X-ray fluorescence system comprising an X-ray source to emit X-ray radiation incident on a sample and a controller to vary an energy of the X ray radiation between a first incident radiation energy and a second incident radiation ener...
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WO/2023/044114A1 |
Methods and systems are provided for downsampling detector data in a computed tomography imaging system. In an example, a method for a photon-counting computed tomography (PCCT) system includes, during a scan of an imaging subject, obtai...
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WO/2023/039702A1 |
An imaging method comprising attaching image agents (515a1, 515a2, 515a3) to portions of an object (500) (720); expanding the portions of the object (500) in three dimensions (3D) (710); generating a 3D image of the image agents (515a1, ...
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WO/2023/043859A1 |
Methods and systems for measuring semiconductor structures based on a trained scanning conditional measurement model are described herein. A scanning conditional model is trained based on Design Of Experiments (DOE) measurement data asso...
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WO/2023/044241A1 |
Described herein are examples of industrial radiography systems that may control, or recommend, certain parameter values of a high resolution, continuous rotation, radiographic imaging process. By controlling, or recommending, the partic...
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WO/2023/037696A1 |
This radiation inspection device is configured to be capable of moving within a plane intersecting a rotation axis such that at least two elements from among a radiation source, a holding means for holding an object being inspected, and ...
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WO/2023/035873A1 |
A radiation protection device and a radiation inspection system. The radiation protection device comprises: a movable carrying device (10), comprising a vehicle frame (11) and a locomotion device (12) for supporting the vehicle frame (11...
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WO/2023/036873A1 |
The invention provides a sample holder arrangement (1) comprising (a) a sample holding part (3) and (b) a base part (30), wherein the sample holding part (3) comprises an open-ended tube (10), wherein the open-ended tube (10) comprises a...
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WO/2023/038871A1 |
The present disclosure provides an inspection system and a method of stray field mitigation. The system includes an array of electron beam columns, a first permanent magnet array, and a plurality of shielding plates. The array of electro...
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WO/2023/037078A1 |
The invention relates to a method for non-destructively testing a part by means of transmission radiography, which method comprises the following steps of acquiring N projections (P(n)) of the part, generating (E2) calculated N images (P...
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WO/2023/035789A1 |
A ray collimation device (100) and a radiation inspection device (200). The ray collimation device (100) comprises a collimation assembly (1), a transmission assembly (2), and a driving assembly (3). The collimation assembly (1) comprise...
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WO/2023/033196A1 |
The present invention relates to an X-ray apparatus for inspecting bones or shells. The X-ray apparatus for inspecting bones or shells comprises: a transfer module (11) for continuously transferring fish or meat which is to be processed ...
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WO/2023/031930A1 |
A process is provided for identifying a production and/or commercial history of latex or rubber or products made therefrom.
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WO/2023/028923A1 |
A measurement method and apparatus for a winding electrode assembly (102). The measurement method comprises: acquiring pixel equivalent parameters corresponding to the ith circle of a winding reference electrode assembly (1'), the pixel ...
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WO/2023/031265A1 |
Providing a magnetic field structure imaging apparatus capable of easily obtaining a magnetic field structure image of a target region. A magnetic field structure imaging apparatus comprising: a first detection unit that detects a passin...
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WO/2023/032286A1 |
In the present invention, an aperture member (1A) narrows the radiation range of primary X-rays generated in an X-ray tube (3). An analysis unit analyzes X-ray fluorescence generated from a sample by irradiating the sample with primary X...
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WO/2023/030581A1 |
The invention relates to a sample carrier (100) for holding a sample in an evacuated environment or a defined gas atmosphere. The sample carrier comprises a cover plate (10) and an electrical operating device (20) which is connected to t...
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WO/2023/034532A1 |
A defect detection and imaging system is presented for performing microscopy and/or spectroscopy on a device under test. The defect detection system comprises a controller for toggling the state of a light source, which may allow for fas...
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WO/2023/030563A1 |
The present invention relates to a method for determining the crystal structure of a crystal (4) capable of electron diffraction. The method includes the steps of obtaining a three-dimensional electron diffraction pattern and processing ...
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WO/2023/024447A1 |
An X-ray CT detection device and an X-ray CT detection method. The X-ray CT detection device comprises an X-ray sensor (1), an X-ray source (2), a movement system unit (3), and an image reconstruction and display unit. The use of the ima...
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WO/2023/027866A1 |
Analyzing a sidewall of a hole milled in a sample to determine thickness of a buried layer includes milling the hole in the sample using a charged particle beam of a focused ion beam (FIB) column to expose the buried layer along the side...
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WO/2023/027991A1 |
Methods and systems for using multiple hyperspectral cameras (112a, 112b, 112) sensitive to different wavelengths to predict characteristics of objects for further processing, including recycling, are described. The multiple hyperspectra...
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WO/2023/024726A1 |
A security check CT object recognition method and apparatus. The method comprises: performing dimension reduction on three-dimensional CT data to generate a plurality of two-dimensional dimension-reduced views (S10); performing object re...
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