Title:
SYSTEMS AND METHODS FOR TIME OF FLIGHT MEASUREMENT IMPLEMENTING THRESHOLD-BASED SAMPLING FOR WAVEFORM DIGITIZING
Document Type and Number:
WIPO Patent Application WO/2024/045227
Kind Code:
A1
Abstract:
Systems and methods which provide time of flight (ToF) measurement techniques implementing threshold-based sampling for waveform digitizing to generate a signal waveform representing a detected ToF measurement signal from which a ToF distance measurement is determinable are described. An example ToF measurement system may apply one or more curve fitting techniques, such as using one or more curve fitting hardware accelerators, to data from threshold-based sampling for waveform digitizing of the received pulse. Examples of a ToF measurement system may implement time-to-digital converters (TDCs) to sample a received pulse using a plurality of thresholds. ToF measurement systems of examples may implement multi-point filtering, such as using a hardware accelerator.
Inventors:
YU WEIWEN (CN)
YUEN KA SING ANTHONY (CN)
YUEN KA SING ANTHONY (CN)
Application Number:
PCT/CN2022/119388
Publication Date:
March 07, 2024
Filing Date:
September 16, 2022
Export Citation:
Assignee:
HONG KONG APPLIED SCIENCE & TECH RESEARCH INST CO LTD (CN)
International Classes:
G01S7/487; G01S17/08; G01S17/10
Foreign References:
| US20190025413A1 | 2019-01-24 | |||
| CN106199622A | 2016-12-07 | |||
| US20190129031A1 | 2019-05-02 | |||
| CN102789952A | 2012-11-21 | |||
| CN109633670A | 2019-04-16 | |||
| US20190033431A1 | 2019-01-31 |
Attorney, Agent or Firm:
CHINA TRUER IP (CN)
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