ZQ CALIBRATION METHOD AND ZQ CALIBRATION CIRCUIT

Title:

ZQ CALIBRATION METHOD AND ZQ CALIBRATION CIRCUIT

Document Type and Number:

WIPO Patent Application WO/2024/082566

Kind Code:

A1

Abstract:

A ZQ calibration method and a ZQ calibration circuit. When being applied to a wafer-level semiconductor chip, the ZQ calibration method comprises: after a target chip is powered on, recognizing whether the target chip has been set to be a master chip (S110); according to a recognition result of the target chip, selecting a corresponding calibration mode to perform ZQ calibration on the target chip (S120); switching, in a test mode, the setting of the target chip to be the master chip or a slave chip (S130); and executing calibration on the target chip again (S140).

Inventors:

LIU ZHIYANG (CN)
TIAN KAI (CN)
GU XUN (CN)

Application Number:

PCT/CN2023/086077

Publication Date:

April 25, 2024

Filing Date:

April 04, 2023

Export Citation:

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Assignee:

CHANGXIN MEMORY TECH INC (CN)

International Classes:

G11C29/02; G11C7/10

Attorney, Agent or Firm:

ADVANCE CHINA IP LAW OFFICE (CN)

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