TEST METHOD AND APPARATUS

WIPO Patent Application WO/2024/093298

A1

Provided in the present application are a test method and apparatus. The method is used for testing an algorithm to be tested of a first service, wherein said algorithm comprises a plurality of algorithm modules, and the plurality of algorithm modules in said algorithm correspond to a plurality of algorithm modules in a reference algorithm of the first service on a one-to-one basis. The method comprises: before testing, inputting first sample data into a reference algorithm of a first service, and determining reference input data and reference output data, which correspond to each algorithm module; and during testing, loading an algorithm to be tested of a first service; according to a test policy, determining a test module from a plurality of algorithm modules of said algorithm, and determining a reference input and a reference output, which correspond to the test module; inputting the reference input data into the test module, so as to obtain test output data output by the test module; and when the test output data is consistent with the reference output data, determining that the testing of the test module is passed. In this way, when a certain module has a test problem, the module having the problem can be accurately positioned, thus realizing the accurate positioning of the test problem.

SUN DONG (CN)
ZHANG SHIJIE (CN)
LIU ZIYUAN (CN)

PCT/CN2023/103496

May 10, 2024

June 28, 2023

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HUAWEI CLOUD COMPUTING TECH CO LTD (CN)

G06F11/36

CN108776640A	2018-11-09
CN113704117A	2021-11-26
CN114840422A	2022-08-02
US20200409827A1	2020-12-31

BEIJING ZBSD PATENT & TRADEMARK AGENT LTD. (CN)

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