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JP5053327B2 |
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JP5041508B2 |
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JP5037506B2 |
A method for screening fiber polarization mode dispersion using a polarization optical time domain reflectometer. A pulse radiation is emitted into the fiber under test, and the backscattered radiation is measured by the POTDR and used t...
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JP2012181098A |
To provide an optical intensity spectrum measuring method and device that are capable of achieving high-wavelength resolution and high-speed measurement simultaneously.An optical intensity spectrum measuring device comprises; a wavelengt...
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JPWO2010100766A1 |
The present invention presents an optical rotation measuring device that can measure the existence and content of an optical rotation body, tissue, blood, molecule, etc. with high accuracy and can be miniaturized, and the existence of an...
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JP5012145B2 |
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JP5014337B2 |
Systems and methods are disclosed for using ellipsometer configurations to measure the partial Mueller matrix and the complete Jones matrix of a system that may be isotropic or anisotropic. In one embodiment two or more signals, which do...
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JP5007979B2 |
Light from a light source device (4) is polarized through a polarizer (5) and is caused to impinge obliquely on an object (W) to be inspected. The resulting scattered light (SB) is received by a CCD imaging device (7) having an element (...
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JP4997385B2 |
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JP4950234B2 |
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and have a high extinction ratio and a low insertion loss, and a polarization ...
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JP4950813B2 |
In a spectroscopic ellipsometer, light emitted from a light source enters a measurement surface of a substrate through an optical system in a lighting part so as to incline to the measurement surface to be directed to a light receiving d...
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JP4947998B2 |
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JP4936477B2 |
The present invention is a birefringence measuring device that requires only three types of light intensity information and can measure birefringence characteristics of an object with a relatively inexpensive device configuration. One em...
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JP2012093098A |
To provide a measuring instrument for measuring the thickness of a thin film in a very small area or two-dimensional distribution of an optical constant at high speed and with high definition.An ellipsometer comprises an incident optical...
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JP4928897B2 |
A polarization evaluation mask for evaluating the state of polarization of an illumination light in exposure equipment comprises a transparent substrate; a light interceptor formed in said transparent substrate and having a plurality of ...
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JP2012083311A |
To provide a miniaturizable high accuracy polarimeter by constituting the polarimeter without using a Faraday cell.A polarimeter generates linearly polarized light by a polarizer 14, branches the linearly polarized light, which has passe...
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JP4921090B2 |
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JP2012068031A |
To separate each polarized light of a polarization multiple signal light in which orthogonal polarized waves with the same wavelength are multiplexed, and to evaluate the characteristics of each signal light.Rays of light made incident o...
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JP4895428B2 |
To provide a method for quickly measuring an orientation parameter such as a pretilt angle on a non-uniform orientation liquid crystal cell and provide a device realizing this method. (1) The specified polarized light is made incident in...
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JP4880122B2 |
A polarized sample beam of broadband radiation is focused onto the surface of a sample and the radiation modified by the sample is collected by means of a mirror system in different planes of incidence. The sample beam focused to the sam...
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JP4880791B2 |
A polarized sample beam of broadband radiation is focused onto the surface of a sample and the radiation modified by the sample is collected by means of a mirror system in different planes of incidence. The sample beam focused to the sam...
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JP4883549B2 |
[Purpose] The object of the present invention is to provide a spectroscope having both a wavelength resolving power and a spatial resolving power. [Solving Means] A spectroscope comprises an incident slit 12, a collimator lens type optic...
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JP4879197B2 |
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JP2012032346A |
To provide evaluation technology for an optical element, by which an optical element having biaxial property can be accurately evaluated.A monochromatic beam 21 is projected onto an evaluation object 10 at an incident plane angle Φ and ...
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JP2012032242A |
To provide a polarization photographing device capable of simplifying calculation to shorten calculation time when calculating an intensity ratio between double images of polarization components orthogonally intersecting from image signa...
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JP4875688B2 |
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JP4842441B2 |
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JP4832187B2 |
A polarizing device including a plurality of polarized light radiating units for radiating polarized light rays each of which is polarized in a particular direction, a rotary reflector for receiving light rays emitted by the plurality of...
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JP4816156B2 |
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JP4781746B2 |
In a method of measurement of the birefringence of an optical fiber, the round-trip Jones matrix R(z) for a first interval (0, z) from a measurement starting point 0 in the optical fiber for measurement to a prescribed position z, and th...
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JP2011186328A |
To provide inexpensive and durable polarizer array, a polarization sensor, and a polarization analysis device using the same.A polarization diffraction grating array includes a plurality of polarization diffraction gratings 11 in each of...
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JP4767086B2 |
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JP4747304B2 |
A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated ...
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JP2011145131A |
To provide a device for evaluating color unevenness of a metallic coating film capable of obtaining the color unevenness of the metallic coating film as a quantitative value highly correlated with visual evaluation.The device 100 for eva...
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JP2011133361A |
To measure a polarization state with high accuracy, by solving the problems wherein when signal intensity becomes markedly small, the polarization state cannot be measured with high accuracy resulting being significantly influenced by th...
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JP4714427B2 |
A method for polishing a thin film formed on a substrate includes planarizing a thin film formed on a reference substrate by a CMP process such that the thin film remains on the reference substrate. After the planarizing, the thin film i...
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JP4694179B2 |
A surface inspection apparatus ( 100 ) comprises a light ( 10 ) source for emitting a light beam L 0 , an optical illumination system ( 30 ) for projecting the light beam on an inspected surface ( 220 ) formed by a film 210 , an optical ...
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JP2011106871A |
To provide a polarimeter which allows a user to intuitively grasp the measurement status by displaying the operating status of the polarimeter.The polarimeter displays an angle display means section 41 for indicating the rotational angle...
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JP2011095252A |
To provide an apparatus for evaluating properties of a resin film, capable of properly evaluating on the spot the properties of the resin film being oriented.An apparatus for evaluating the properties of the resin film while orienting th...
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JP4653112B2 |
This invention provides a novel, rapid method and device for determining the relative phase retardation of different layers of a multi-layered specimen, which is related to the thicknesses of its layers and walls, and the orientations of...
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JP4653311B2 |
The invention concerns an apparatus for optically characterising a thin-layer material by backscattering Raman spectometry comprising a frame, a monochromatic excitation laser source (21), optical means (23, 24) directing a light flux em...
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JP4642276B2 |
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JP4637454B2 |
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JP4638486B2 |
A device capable of efficiently detecting a single-photon signal preserves a photon characteristic such as polarization or angular momentum. The device can include a beam splitter that splits an input photon state into modes that are dis...
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JP4629869B2 |
A practical system and method for precisely measuring low-level birefrigence properties (retardance and fast axis orientation) of optical materials (26). The system permits multiple measurements to be taken across the area of a sample to...
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JP4625908B2 |
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JP2011014660A |
To provide a measurement apparatus which measures the polarization state of a light beam to be inspected with high accuracy by reducing the influence of a manufacturing error of the measurement apparatus on the measurement results.The me...
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JP4616567B2 |
An ellipsometer measures any point of a sample by a first spectrometer and a second spectrometer. The ellipsometer performs analysis based on the measurement results obtained by the first spectrometer, performs analysis based on the meas...
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JP2011501166A |
An apparatus for determining fiber orientation parameters of a sheet of material during a production process includes a polarized radiation generating system operable for providing polarized radiation having a frequency of at least 1×10...
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JP2010286248A |
To provide a polarization analyzer which can measure a state of polarization and the degree of polarization with high accuracy.The polarization analyzer 91 includes a non-polarized light source 11 which outputs non-polarized light, an op...
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