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Title:
THERMAL HISTORY EVALUATION METHOD AND THERMAL HISTORY EVALUATION DEVICE FOR HEAT-RESISTANT MEMBER
Document Type and Number:
WIPO Patent Application WO/2021/040041
Kind Code:
A1
Abstract:
A thermal history evaluation method that involves arranging a plurality of first temperature detection members at specific inspection sites on a heat-resistant member. The first temperature detection members are capable of detecting temperature on the basis of property changes caused by thermal aging. The thermal history of the heat-resistant member is found on the basis of changes in the properties of the plurality of first temperature detection members.

Inventors:
YOSHIDA SHIGERU (JP)
HIGUCHI TOMOHIRO (JP)
SAKATA FUMITOSHI (JP)
Application Number:
PCT/JP2020/032822
Publication Date:
March 04, 2021
Filing Date:
August 31, 2020
Export Citation:
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Assignee:
MITSUBISHI POWER LTD (JP)
International Classes:
G01K11/06; F22B37/02; F22B37/38; G01K1/14; G01K11/12
Foreign References:
JPS4928074U1974-03-11
JPH0514868U1993-02-26
JP2004163061A2004-06-10
JP2017161332A2017-09-14
JP2014228196A2014-12-08
Attorney, Agent or Firm:
SEISHIN IP PATENT FIRM, P.C. (JP)
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