Title:
SURVEYING SYSTEM, SURVEYING METHOD, AND SURVEYING PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/029163
Kind Code:
A1
Abstract:
A surveying system (1) includes: a target device (3) that includes a pole (14) and a target (15) having a known distance from the bottom end of the pole; and a surveying device (2) that is capable of measuring the target. The surveying system is configured such that the pole is pivoted with the bottom end of the pole positioned at a prescribed measurement point (13), the surveying device measures the target at at least three points, three-dimensional coordinates of a virtual measurement point are computed on the basis of the results of measurement of individual targets, the degree of matching between the measurement point and the virtual measurement point is computed as a confidence, and an operation for finishing measurement is performed when the confidence satisfies a preset threshold.
Inventors:
NISHITA NOBUYUKI (JP)
TANAKA TAKASHI (JP)
SHIGETA MASAHIRO (JP)
TANAKA TAKASHI (JP)
SHIGETA MASAHIRO (JP)
Application Number:
PCT/JP2023/018934
Publication Date:
February 08, 2024
Filing Date:
May 22, 2023
Export Citation:
Assignee:
TOPCON CORP (JP)
International Classes:
G01C15/00
Foreign References:
| US20210372768A1 | 2021-12-02 | |||
| US20130253871A1 | 2013-09-26 |
Attorney, Agent or Firm:
MIYOSHI Shoji (JP)
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