Title:
SURFACE DEFECT DATA ENHANCEMENT METHOD AND APPARATUS, AND ELECTRONIC DEVICE AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/082925
Kind Code:
A1
Abstract:
Provided in the present disclosure are a surface defect data enhancement method and apparatus, and an electronic device and a storage medium. The surface defect data enhancement method comprises: acquiring surface defect data to be enhanced; acquiring information about a part to be enhanced; dividing the surface defect data according to the information about the part to be enhanced; and performing data enhancement on the divided surface defect data. Surface defect data is divided according to information about a part to be enhanced, and data enhancement is then respectively performed on the divided surface defect data, such that data enhancement for a specific position is realized, thereby realizing surface defect detection for the specific position.
Inventors:
HU JIANGHONG (CN)
CAO BIN (CN)
CHEN LIMING (CN)
YAN WENZHONG (CN)
TIAN KAI (CN)
MA YUAN (CN)
LI ZHI (CN)
CAO BIN (CN)
CHEN LIMING (CN)
YAN WENZHONG (CN)
TIAN KAI (CN)
MA YUAN (CN)
LI ZHI (CN)
Application Number:
PCT/CN2023/121002
Publication Date:
April 25, 2024
Filing Date:
September 25, 2023
Export Citation:
Assignee:
FITOW TIANJIN DETECTION TECH CO LTD (CN)
International Classes:
G06T7/00; G06T5/00
Foreign References:
| CN115330803A | 2022-11-11 | |||
| CN109211919A | 2019-01-15 | |||
| CN107633491A | 2018-01-26 | |||
| CN110969611A | 2020-04-07 | |||
| CN113256608A | 2021-08-13 |
Attorney, Agent or Firm:
CHOFN INTELLECTUAL PROPERTY (CN)
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