Title:
STRAIN MEASURING SENSOR AND MANUFACTURING METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2023/282386
Kind Code:
A1
Abstract:
A strain measuring sensor according to the present invention may comprise: a substrate layer formed of a flexible material; and a conductive thin-film layer provided on a surface of the substrate layer and having at least any one pattern with irregular straight lines or irregular curves.
Inventors:
KIM HOE JOON (KR)
RYU CHAE HYUN (KR)
RYU CHAE HYUN (KR)
Application Number:
PCT/KR2021/012819
Publication Date:
January 12, 2023
Filing Date:
September 17, 2021
Export Citation:
Assignee:
DAEGU GYEONGBUK INST SCIENCE & TECH (KR)
International Classes:
G01B7/16; C25D5/00; C30B7/00; C30B7/12; C30B29/10; G01L1/22; H01B1/12; H01B5/14
Foreign References:
| KR101946150B1 | 2019-02-08 | |||
| KR102094134B1 | 2020-03-27 | |||
| KR20170117000A | 2017-10-20 | |||
| KR20210026510A | 2021-03-10 | |||
| US20080191177A1 | 2008-08-14 |
Attorney, Agent or Firm:
KIM, Youn Gwon (KR)
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