Title:
SPECIMEN MEASURING METHOD, LID OF MULTIWELL PLATE, SPECIMEN MEASURING KIT, AND SPECIMEN MEASURING DEVICE
Document Type and Number:
WIPO Patent Application WO/2019/151542
Kind Code:
A1
Abstract:
The objective of the present invention is to provide a specimen measuring method with which an instrument having a simple structure can be utilized, and which can be applied to adhesion-dependent or planktonic cells, for example, and to provide a lid of multiwell plate, a specimen measuring kit, and a specimen measuring device. This method for measuring the state of a liquid specimen using a multiwell plate includes: a step of preparing a multiwell plate 10 having a liquid specimen S injected into each well 12; a step of placing a lid 20 onto the multiwell plate; and a step of measuring the state of the specimen. The lid includes a plurality of protruding portions 22 corresponding to each well in the multiwell plate, wherein the protruding portions are configured in such a way that, when the lid is attached to the multiwell plate, a distal end of each protruding portion comes into contact with the specimen while being separated from the bottom of the well. The step of measuring the state of the specimen includes a step of radiating exciting light from below the multiwell plate onto fluorescent material 30 provided at the distal ends of the protruding portions, and receiving fluorescence therefrom.
Inventors:
ISHIKAWA YOICHI (JP)
Application Number:
PCT/JP2019/004318
Publication Date:
August 08, 2019
Filing Date:
January 31, 2019
Export Citation:
Assignee:
ABLE CORP (JP)
International Classes:
G01N21/64; C12M1/34; C12Q1/02; G01N21/03
Domestic Patent References:
| WO2014189085A1 | 2014-11-27 | |||
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