Title:
PROBE DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/024327
Kind Code:
A1
Abstract:
This probe device comprises: a case having a first surface and a second surface; an electrically conductive probe having a first contact section exposed at a first surface and a second contact section exposed at a second surface; and an elastic section disposed inside the case. The probe undergoes a change in orientation inside the case such that the position of a contact region, of the second contact section, which contacts an electrode pad changes according to displacement of the first contact section. The elastic section includes: a first elastic member; and a second elastic member that is integrally formed with the first elastic member, and that reinforces the elastic force of the first elastic member. The elastic section undergoes elastic deformation in response to a change in orientation of the probe inside the case, and biases the probe in a direction canceling the displacement of the first contact section.
Inventors:
KUGA TOMOAKI (JP)
Application Number:
PCT/JP2023/022461
Publication Date:
February 01, 2024
Filing Date:
June 16, 2023
Export Citation:
Assignee:
NIHON MICRONICS KK (JP)
International Classes:
G01R1/073; G01R1/06; G01R1/067; G01R31/26; G01R31/28; H01R33/76
Foreign References:
| JP2010096702A | 2010-04-30 | |||
| JP2003123874A | 2003-04-25 | |||
| JPH0720566U | 1995-04-11 | |||
| JP2006010588A | 2006-01-12 | |||
| JPH1131566A | 1999-02-02 | |||
| JP2013061188A | 2013-04-04 | |||
| US6093030A | 2000-07-25 | |||
| JP2019035660A | 2019-03-07 |
Attorney, Agent or Firm:
MIYOSHI Hidekazu et al. (JP)
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