Title:
PROBE, AND CONNECTOR INSPECTION DEVICE COMPRISING PROBE
Document Type and Number:
WIPO Patent Application WO/2021/241232
Kind Code:
A1
Abstract:
Provided is a probe that accurately inspects the characteristics of a connector. The probe 1 comprises: a housing 40 in which a signal line 70 is inserted; a plunger 20 having a measurement end 72 for inspecting the characteristics of a connector 6, the signal line being connected to the plunger; and an electroconductive flange 10 secured to an electroconductive inspection platform 50. The flange has: a line through-hole 12 into which the housing is inserted; and at least one securing through-hole 13 positioned on the side opposite from the line through-hole, an electroconductive securing member being inserted into the at least one securing through-hole. The flange is electrically connected and secured to the inspection platform by a securing member 30. The securing through-hole is obstructed by a head part 31 of the securing member as seen from the thickness direction Z of the flange. At least one cutout 14 that engages with at least one positioning pin 54 erected on the inspection platform is formed in the outer edge 18 of the flange.
Inventors:
MURANAKA MITSUYO (JP)
Application Number:
PCT/JP2021/018076
Publication Date:
December 02, 2021
Filing Date:
May 12, 2021
Export Citation:
Assignee:
MURATA MANUFACTURING CO (JP)
International Classes:
G01R27/28; G01R1/067; G01R1/073; H01R13/24; H01R43/00
Domestic Patent References:
| WO2019069576A1 | 2019-04-11 |
Foreign References:
| US20170003317A1 | 2017-01-05 | |||
| US5524281A | 1996-06-04 | |||
| JP2019138768A | 2019-08-22 | |||
| JP2018511058A | 2018-04-19 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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