Title:
NONDESTRUCTIVE INSPECTING DEVICE, NONDESTRUCTIVE INSPECTING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/024309
Kind Code:
A1
Abstract:
Provided are a nondestructive inspecting device, a nondestructive inspecting method, and a program capable of detecting even minute defects at low cost. The nondestructive inspecting device of the present invention comprises: a transmitting unit for transmitting wave motion to a target object; a receiving unit for generating a reception signal by receiving the wave motion propagated through the target object, at a plurality of reception positions on a line or a plane orthogonal to a transmission direction of the wave motion; and an information generating unit for subjecting the reception signal and a predetermined reference signal to predetermined non-linear processing to generate phase shift information indicating a phase shift between the reception signal and the reference signal at each reception position.
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Inventors:
FUSE MASARU
AOKI MEGUMI
AOKI MEGUMI
Application Number:
PCT/JP2023/021968
Publication Date:
February 01, 2024
Filing Date:
June 13, 2023
Export Citation:
Assignee:
KONICA MINOLTA INC (JP)
International Classes:
G01N29/50
Domestic Patent References:
| WO2019021538A1 | 2019-01-31 |
Foreign References:
| US4843847A | 1989-07-04 | |||
| JPS541681A | 1979-01-08 | |||
| JPH0526854A | 1993-02-02 | |||
| JPS55159139A | 1980-12-11 | |||
| JP2011196877A | 2011-10-06 | |||
| JP2008545123A | 2008-12-11 | |||
| JP2004515748A | 2004-05-27 | |||
| JP2020094939A | 2020-06-18 | |||
| JP2018054392A | 2018-04-05 |
Attorney, Agent or Firm:
WASHIDA & ASSOCIATES (JP)
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