Title:
METHOD FOR EVALUATING QUALITY OF RETINAL IMPLANT
Document Type and Number:
WIPO Patent Application WO/2024/085251
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide a method for evaluating the quality of a retinal implant without actually performing retinal implanting. The present invention relates to a method for evaluating the quality of a retinal implant and includes: a step for preparing at least a portion of a cell population containing the retinal implant as a test sample; a step for acquiring a test cell population by culturing the test sample in the presence of a Notch signal inhibitor or in the presence of a retinoic acid; a step for measuring, in the test cell population, the proportion of cells expressing a marker for photoreceptor cells or the expression levels of (i) genes related to photoreceptor cell maturation, (ii) genes related to synapse formation, and (iii) photoreceptor accessory genes; and a step for comparing the measured proportion or expression levels with values measured in a control population.
Inventors:
KUWAHARA ATSUSHI (JP)
TERAI ORIE (JP)
UEYAMA KAZUKI (JP)
NAKAMURA AYA (JP)
TERAI ORIE (JP)
UEYAMA KAZUKI (JP)
NAKAMURA AYA (JP)
Application Number:
PCT/JP2023/038051
Publication Date:
April 25, 2024
Filing Date:
October 20, 2023
Export Citation:
Assignee:
SUMITOMO PHARMA CO LTD (JP)
International Classes:
C12N5/079; C12N5/10; C12Q1/04; G01N33/48; C12N5/0735; C12N5/074
Attorney, Agent or Firm:
TANAKA Shinichiro et al. (JP)
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