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Title:
METHOD FOR CONTROLLING SAMPLE PRETREATMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/131167
Kind Code:
A1
Abstract:
This method is for controlling a sample pretreatment device 1 of a sample inspection automation system in which a sample pretreatment device for performing pretreatment of a sample to be used in mass spectrometry, a mass spectrometer, and another automatic analysis device are connected to each other. The method includes: assessing serum information by referring to previous value information or a measurement result of the sample by the other automatic analysis device; determining, on the basis of the serum information, a cleaning process condition for removing impurities included in the sample during sample pretreatment; and dispensing, on the basis of the condition, a cleaning liquid to a reaction container for mixing the sample with a reagent. This method makes it possible to maintain accuracy of measurement by a mass spectrometer without installing a new component and without a major change in the measurement process by an automatic analysis device.

Inventors:
SUZUKI AKIKO (JP)
MATSUOKA SHINYA (JP)
EBIHARA DAISUKE (JP)
MATSUO SUMIAKI (JP)
Application Number:
PCT/JP2021/045656
Publication Date:
June 23, 2022
Filing Date:
December 10, 2021
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/00; G01N1/00; G01N1/10; G01N35/02
Domestic Patent References:
WO2016194825A12016-12-08
WO2013099660A12013-07-04
Foreign References:
JP2018109520A2018-07-12
JPS62146963U1987-09-17
Attorney, Agent or Firm:
KAICHI IP (JP)
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