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Patent Searching and Data


Title:
MEASURING DEVICE AND SELECTION DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/176751
Kind Code:
A1
Abstract:
This measuring device that is for measuring a condition of an object comprises: a transport unit that transports the object; an electromagnetic wave radiation source; a sensor that is configured so as to detect at least one of reflected electromagnetic waves reflected by the object and transmitted electromagnetic waves transmitted by the object; an identification unit that is configured so as to identify a condition of the object on the basis of a signal acquired by the sensor; and a radiation control unit that is configured so as to control the radiation of electromagnetic waves from the electromagnetic wave radiation source. The electromagnetic wave radiation source includes a first radiation source and a second radiation source that differ with regard to at least one of the wavelength range of electromagnetic waves radiated thereby and the positioning location thereof. The radiation control unit controls the electromagnetic wave radiation source such that first radiation periods, which are periods in which the first radiation source radiates electromagnetic waves, and second radiation periods, which are periods in which the second radiation source radiates electromagnetic waves, occur alternately without overlapping.

Inventors:
FUSHIDA SHINYA (JP)
TAKEUCHI HIROAKI (JP)
Application Number:
PCT/JP2023/009530
Publication Date:
September 21, 2023
Filing Date:
March 13, 2023
Export Citation:
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Assignee:
SATAKE ENG CO LTD (JP)
International Classes:
G01N21/85; B07C5/342
Foreign References:
JP2021085846A2021-06-03
JP2016197065A2016-11-24
US6130743A2000-10-10
JP2021090934A2021-06-17
JP2020085622A2020-06-04
JPH10202204A1998-08-04
Attorney, Agent or Firm:
YUCHI INTERNATIONAL PATENT FIRM (JP)
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