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Patent Searching and Data


Title:
MEASURING DEVICE AND MOUNTING MACHINE
Document Type and Number:
WIPO Patent Application WO/2024/084547
Kind Code:
A1
Abstract:
The present invention addresses the problem of determining the presence or absence of stains on at least one of a pair of opposing surfaces without using an image captured by a camera. As a means of solving the problem, whether stains are present in at least one of the pair of opposing surfaces in the present measurement device is determined on the basis of a measurement value of electrical characteristics of a predetermined set object. For example, when stains are present on at least one of the pair of opposing surfaces, the current is unable to flow easily, or the area of the pair of opposing surfaces becomes substantially smaller. Therefore, in comparison to when stains are absent, when stains are present on at least one of the pair of opposing surfaces, the measured value of the resistance, as an electrical characteristic of the set object, becomes larger, or the measured value of the electrostatic capacity, as the electrical characteristic, becomes smaller. Thus, in the present measurement device, the presence or absence of stains on at least one of the pair of opposing surfaces can be satisfactorily determined without using an image captured by the camera.

Inventors:
AOKI SHINGO (JP)
MATSUYAMA KAZUYA (JP)
KAWAGUCHI MASANORI (JP)
MATSUMOTO MASANARI (JP)
Application Number:
PCT/JP2022/038556
Publication Date:
April 25, 2024
Filing Date:
October 17, 2022
Export Citation:
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Assignee:
FUJI CORP (JP)
International Classes:
H05K13/08
Domestic Patent References:
WO2018167880A12018-09-20
Foreign References:
JP2018174249A2018-11-08
JP2012173182A2012-09-10
Attorney, Agent or Firm:
CHUBU PATENT OFFICE (JP)
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