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Title:
LOSSLESS COMPRESSION AND DECOMPRESSION METHODS FOR TEST VECTOR
Document Type and Number:
WIPO Patent Application WO/2021/052329
Kind Code:
A1
Abstract:
Disclosed is a lossless compression method for a test vector, the method comprising the following steps: S01: converting a test vector into a data stream of A rows and B columns, wherein the data stream is expressed using a binary system; S02, sequentially compressing the data stream column-by-column to form compressed words and non-compressed words corresponding to each column of data, wherein specifically, the method for compressing each column of data comprises the steps of setting a window to have a width of one bit and a depth of M rows, and sliding the window downwards row-by-row from the top of the column of data to sequentially form compressed words and non-compressed words of each column; and S03, converging the compressed data of each column of data to form a compressed data stream. The present invention provides lossless compression and decompression methods for a test vector, and the compression method is simple and rapid, and is applicable to the field of ATE tests.

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Inventors:
CHEN TING (CN)
Application Number:
PCT/CN2020/115359
Publication Date:
March 25, 2021
Filing Date:
September 15, 2020
Export Citation:
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Assignee:
SHANGHAI NCATEST TECH CO LTD (CN)
International Classes:
H03M7/30
Foreign References:
CN110719105A2020-01-21
CN107040791A2017-08-11
CN101158706A2008-04-09
CN1949670A2007-04-18
CN104656009A2015-05-27
US20100223237A12010-09-02
US20080263418A12008-10-23
KR20080019140A2008-03-03
Other References:
TENG LIN ; JIANHUA FENG ; YANGYUAN WANG: "A New Test Data Compression Scheme for Multi-scan Designs", VLSI, 2007. ISVLSI 07. IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON, IEEE, PI, 1 March 2007 (2007-03-01), Pi, pages 179 - 185, XP031090672, ISBN: 978-0-7695-2896-0
HAMIDREZA HASHEMPOUR ; FABRIZIO LOMBARDI: "A Novel Methodology for Functional Test Data Compression by ATE", DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, 2006. DFT 06. 21ST I EEE INTERNATIONAL SYMPOSIUM ON, IEEE, PI, 1 October 2006 (2006-10-01), Pi, pages 128 - 135, XP031030639, ISBN: 978-0-7695-2706-2
Attorney, Agent or Firm:
SHANGHAI TIANCHEN INTELLECTUAL PROPERTY AGENCY (CN)
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