Title:
INTEGRITY MEASUREMENT METHOD AND APPARATUS
Document Type and Number:
WIPO Patent Application WO/2024/078159
Kind Code:
A1
Abstract:
Provided in the embodiments of the present application are an integrity measurement method and an apparatus. An electronic device used in the method comprises two environments a TEE and a non-TEE, wherein the TEE comprises a first trusted region and a TEE management module, and the first trusted region is isolated from each component in the non-TEE and other trusted regions in the TEE, that is, in case of not being authorized, each component in the non-TEE and components in the other trusted regions in the TEE do not have rights to access components in the first trusted region. In the embodiments of the present application, a measurement module used for performing integrity measurement is located inside the first trusted region, and a lightweight TEE management module is used as a trusted base to perform integrity measurement processes, so that while the measurement module is enabled to have isolation performance that prevents same from being directly or indirectly attacked by other components, the risk of being attacked by trusted bases, namely TEE managers, can be further reduced.
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Inventors:
ZHU SHAOFENG (CN)
ZUO PENG (CN)
ZHANG XIAOHU (CN)
ZUO PENG (CN)
ZHANG XIAOHU (CN)
Application Number:
PCT/CN2023/115263
Publication Date:
April 18, 2024
Filing Date:
August 28, 2023
Export Citation:
Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G06F21/64; G06F21/57
Foreign References:
| CN116257889A | 2023-06-13 | |||
| CN112434306A | 2021-03-02 | |||
| CN114462051A | 2022-05-10 | |||
| CN111859394A | 2020-10-30 | |||
| CN111125707A | 2020-05-08 |
Attorney, Agent or Firm:
BEIJING RUN ZEHENG INTELLECTUAL PROPERTY LAW FIRM (CN)
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