Title:
INSPECTION DEVICE, COMPONENT MOUNTING SYSTEM, AND SUBSTRATE MANUFACTURING METHOD
Document Type and Number:
WIPO Patent Application WO/2021/246091
Kind Code:
A1
Abstract:
The present invention determines whether or not identification information (first identification information) in a component position detection method used when a mounting component position is detected by an inspection device coincides with identification information (second identification information) in a component position detection method used when a holding component position is detected by a component mounting device. When the first identification information coincides with the second identification information, an operation parameter when a mounting head mounts a component on a substrate is corrected on the basis of a misalignment amount calculated by the inspection device. However, when the first identification information does not coincide with the second identification information, the misalignment amount of a component for which the first identification information does not coincide with the second identification information is not used as data for calculating a correction value of the operation parameter.
Inventors:
KIHARA MASAHIRO
YOKOI TAKAAKI
TANIGUCHI MASAHIRO
NAGAYA TOSHIHIKO
AKASAKA MASAHIKO
YOKOI TAKAAKI
TANIGUCHI MASAHIRO
NAGAYA TOSHIHIKO
AKASAKA MASAHIKO
Application Number:
PCT/JP2021/016757
Publication Date:
December 09, 2021
Filing Date:
April 27, 2021
Export Citation:
Assignee:
PANASONIC IP MAN CO LTD (JP)
International Classes:
H05K13/00; H05K13/04; H05K13/08
Domestic Patent References:
| WO2009041005A1 | 2009-04-02 | |||
| WO2017187527A1 | 2017-11-02 | |||
| WO2009093445A1 | 2009-07-30 |
Foreign References:
| JP2014107522A | 2014-06-09 | |||
| JP2016058604A | 2016-04-21 | |||
| JP2015099863A | 2015-05-28 |
Attorney, Agent or Firm:
KAMATA Kenji et al. (JP)
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