Title:
INSPECTION CONDITION DETERMINATION SYSTEM
Document Type and Number:
WIPO Patent Application WO/2024/080087
Kind Code:
A1
Abstract:
The present invention makes it possible to suitably determine inspection conditions in an inspection system. In a computer 200 which comprises a processor 202 and determines the inspection conditions of the inspection system with respect to an inspection object, the processor 202 is configured to: receive, with respect to the inspection in the inspection system, at least two of element evaluation indexes and an input of a user request pertaining to a target of the element evaluation indexes, the element evaluation indexes including a rate of inspection correct answers, a misinformation rate, an inspection time, inspection reproducibility, a training time, the device cost, the operation cost, the device robustness, versatility of inspection, the lifespan, ease of assembly, accuracy of required assembly, robustness to environment, ease of maintenance, clarity of the grounds of determination of recognition processing, or ease of recognition of detection points; generate evaluation indexes based on the plurality of element evaluation indexes for the inspection in the inspection system on the basis of the user request; evaluate, through the evaluation indexes, the inspection result in the plurality of inspection conditions; and determine suitable inspection conditions from among the plurality of inspection conditions.
Inventors:
KASAI HIROAKI (JP)
MIYAMOTO ATSUSHI (JP)
OSAKI MAYUKA (JP)
MIYAMOTO ATSUSHI (JP)
OSAKI MAYUKA (JP)
Application Number:
PCT/JP2023/034056
Publication Date:
April 18, 2024
Filing Date:
September 20, 2023
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G01N21/88
Domestic Patent References:
| WO2018225406A1 | 2018-12-13 |
Foreign References:
| JP2019158499A | 2019-09-19 | |||
| JP2021086432A | 2021-06-03 | |||
| JP2019090643A | 2019-06-13 | |||
| JP2020201106A | 2020-12-17 | |||
| JP2006292725A | 2006-10-26 | |||
| JP2019032605A | 2019-02-28 | |||
| JP2021515927A | 2021-06-24 | |||
| JP2002323458A | 2002-11-08 | |||
| JP2009014447A | 2009-01-22 |
Attorney, Agent or Firm:
WILLFORT INTERNATIONAL PATENT FIRM (JP)
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