Title:
INSPECTING METHOD AND INSPECTING DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/084849
Kind Code:
A1
Abstract:
This inspecting method includes: an inspection image acquisition step for acquiring an inspection image of an object being inspected; a first outline acquisition step for dividing the inspection image into a provisional inspection region and a provisional non-inspection region on the basis of a feature of the inspection region, and acquiring a boundary line between the provisional inspection region and the provisional non-inspection region, as a first outline; and an inspection step for comparing the first outline and a pre-stored feature, serving as a reference, and if there is a specific part in which the first outline is separated from the feature serving as a reference by at least a certain distance, using the feature serving as a reference to correct the specific part of the first outline, and acquiring a second outline, dividing the inspection image into an inspection region and a non-inspection region on the basis of the second outline, and inspecting the inspection region.
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Inventors:
FUJIOKA TAKAHIRO (JP)
Application Number:
PCT/JP2022/029623
Publication Date:
May 19, 2023
Filing Date:
August 02, 2022
Export Citation:
Assignee:
HITACHI ASTEMO LTD (JP)
International Classes:
G01N21/88; G06T7/00; G06T7/12
Foreign References:
| JP2013191064A | 2013-09-26 | |||
| JP2011196982A | 2011-10-06 | |||
| JP2011214903A | 2011-10-27 | |||
| JP2013140090A | 2013-07-18 | |||
| JP2003149165A | 2003-05-21 |
Attorney, Agent or Firm:
YAMAMOTO, Osamu et al. (JP)
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