FLAW DETECTION TEST METHOD

WIPO Patent Application WO/2022/049849

A1

This flaw detection test method (1) uses a flaw detection image of an object from an ultrasonic flaw detector (hereinafter referred to as a flaw detector). The flaw detection test method (1) comprises: a terminal attachment step (2) for allowing a worker to wear a wearable terminal that displays a flaw detection image; a device disposition step (3) for disposing a flaw detector on an object; and a scanning step (6) for causing the flaw detector to scan the object. The flaw detection test method (1) further comprises: a scanning state checking step for allowing the worker to check, using the wearable terminal, a flaw detection image from the flaw detector performing the scanning; and a scanning state adjustment step for, when the checked flaw detection image is inappropriate, allowing the worker to adjust the scanning state of the flaw detector such that the flaw detection image becomes appropriate. The flaw detection test method (1) further comprises a storage step for electronically storing the flaw detection image when the checked flaw detection image is appropriate or when the scanning state has been adjusted.

WO/2024/102617	INSPECTION APPARATUS WITH INTEGRATED ELECTRONICS
JPS592341	[Title of the Invention] A resolution improvement apparatus of a real time type ultrasonic wave shadow device

KOBAYASHI YUICHI (JP)
SHINODA KAORU (JP)
KATAYAMA TAKERU (JP)
ABE MASAMITSU (JP)

PCT/JP2021/021631

March 10, 2022

June 07, 2021

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HITACHI ZOSEN CORP (JP)

G01N29/06; G01N29/265

WO2020079780A1

2020-04-23

JP2020039645A	2020-03-19
JP2016008845A	2016-01-18
US20170095228A1	2017-04-06
JP2019193093A	2019-10-31
JPS58118740A	1983-07-14

MORIMOTO INT'L PATENT OFFICE (JP)

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