Title:
FAULT DETECTION APPARATUS AND DETECTION METHOD FOR RANDOM ACCESS MEMORY
Document Type and Number:
WIPO Patent Application WO/2024/082844
Kind Code:
A1
Abstract:
The present application relates to the field of memory fault detection of computing devices. Disclosed are a fault detection apparatus and method for a random access memory. Accordingly, when a memory fails, a faulty random access memory can be determined in a timely manner, thus improving the accuracy and timeliness of memory fault detection. The fault detection apparatus comprises a memory management controller and a latch, wherein an input end of the memory management controller is connected to a random access memory, and an output end of the memory management controller is connected to an input end of the latch; and the memory management controller is used for detecting correctable errors (CEs) of the random access memory and determining the number of CEs of the random access memory, and when the number of CEs of the random access memory exceeds a preset threshold, the memory management controller sends a latch signal to the latch.
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Inventors:
WANG WEI (CN)
Application Number:
PCT/CN2023/116850
Publication Date:
April 25, 2024
Filing Date:
September 04, 2023
Export Citation:
Assignee:
XFUSION DIGITAL TECH CO LTD (CN)
International Classes:
G06F11/07
Foreign References:
| CN115480947A | 2022-12-16 | |||
| CN102411532A | 2012-04-11 | |||
| CN114064333A | 2022-02-18 | |||
| CN114090316A | 2022-02-25 | |||
| CN113535509A | 2021-10-22 | |||
| US6075929A | 2000-06-13 |
Attorney, Agent or Firm:
LEADER PATENT & TRADEMARK FIRM (CN)
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