Title:
ELECTRICITY STORAGE ELEMENT DEGRADATION STATE CALCULATING DEVICE, DEGRADATION STATE CALCULATING METHOD, DEGRADATION STATE CALCULATING PROGRAM, DEGRADATION STATE ESTIMATING DEVICE, DEGRADATION STATE ESTIMATING METHOD, ABNORMALITY DETECTING DEVICE, AND ABNORMALITY DETECTING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/057996
Kind Code:
A1
Abstract:
Provided are a calculating device, etc., capable of accurately calculating current and future degradation states of an electricity storage element. The calculating device comprises: an acquiring unit for acquiring actual measurement data and virtual measurement data relating to the electricity storage element; and a calculating unit for calculating the current and future degradation states of the electricity storage element on the basis of the measurement data relating to the electricity storage element. If the current degradation state is to be calculated, the calculating unit calculates the degradation state in accordance with a predetermined calculation algorithm on the basis of the actual measurement data acquired by the acquiring unit, and if the future degradation state is to be calculated, the calculating unit calculates the degradation state in accordance with the predetermined calculation algorithm on the basis of the virtual measurement data acquired by the acquiring unit.
Inventors:
UKUMORI NAN (JP)
Application Number:
PCT/JP2023/032309
Publication Date:
March 21, 2024
Filing Date:
September 05, 2023
Export Citation:
Assignee:
GS YUASA INT LTD (JP)
International Classes:
G01R31/392; G01R31/367; G01R31/382; G01R31/385; G01R31/387; G01R31/389; G01R31/396; H01M10/42; H01M10/48; H02J7/00
Domestic Patent References:
| WO2016002398A1 | 2016-01-07 | |||
| WO2016194082A1 | 2016-12-08 |
Foreign References:
| JP2022064054A | 2022-04-25 | |||
| JP2021093253A | 2021-06-17 | |||
| JP2017050126A | 2017-03-09 | |||
| JP2011196906A | 2011-10-06 | |||
| JP2007195312A | 2007-08-02 | |||
| JP2023013116A | 2023-01-26 |
Attorney, Agent or Firm:
KOHNO, Hideto et al. (JP)
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