Title:
DEVICES AND METHODS INVOLVING SEMICONDUCTING MATERIAL(S) FOR PHOTOCATHODES
Document Type and Number:
WIPO Patent Application WO/2023/239382
Kind Code:
A3
Abstract:
Among various examples, one is directed to identifying one or more particular photocathode semiconductor structures via a computer-based method. The method includes calculating, for each of a plurality of semiconductor materials and via a database characterizing electronic band structures of respective semiconductor materials corresponding to the plurality of semiconductor materials, an intrinsic emittance score (e g., using an optimistic selection of a work function) as a predictive screening metric for whether the semiconductor material may exhibit low intrinsic emittance. A subset of the semiconductor materials may be selected, wherein each of the semiconductor materials in the subset satisfies screening criteria based on the intrinsic emittance score, and photocathode brightness properties of said one or more of the semiconductor materials in the subset are characterized, thereby identifying certain semiconductor materials in the subset of the semiconductor materials with desirable photocathode brightness properties.
Inventors:
ANTONIUK EVAN (US)
DUNHAM BRUCE (US)
PIANETTA PIERO (US)
VECCHIONE THEODORE (US)
REED EVAN
DUNHAM BRUCE (US)
PIANETTA PIERO (US)
VECCHIONE THEODORE (US)
REED EVAN
Application Number:
PCT/US2022/033678
Publication Date:
April 25, 2024
Filing Date:
June 15, 2022
Export Citation:
Assignee:
UNIV LELAND STANFORD JUNIOR (US)
International Classes:
H01J1/34; G06F30/32; H01L33/00
Attorney, Agent or Firm:
CRAWFORD, Robert, J. (US)
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