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Title:
DEFECT DETECTION METHOD, APPARATUS AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2023/077404
Kind Code:
A1
Abstract:
The embodiments of the present application relate to the technical field of defect detection. Provided are a defect detection method, apparatus and system. The method comprises: acquiring an average grayscale value of an image of an object to be subjected to detection; constructing a mapping table, wherein an element of the mapping table comprises a mapping value corresponding to each grayscale value within the grayscale value range of the image, a mapping value corresponding to a grayscale value which is greater than or equal to a reference value is a first value, a mapping value corresponding to a grayscale value which is less than the reference value is a second value, and the reference value is the absolute value of the difference value between the average grayscale value and a preset grayscale value; searching the mapping table for a mapping value which corresponds to the grayscale value of each pixel in the image; according to the mapping value corresponding to the grayscale value of each pixel, obtaining, by means of segmentation, at least one suspected defective sub-image from the image, wherein the mapping value corresponding to the grayscale value of each pixel in each suspected defective sub-image is the first value; and inputting the at least one suspected defective sub-image into a machine learning model, so as to obtain a defect detection result.

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Inventors:
NIU MAOLONG (CN)
HUANG QIANGWEI (CN)
XIE JINTAN (CN)
LIU YONGFA (CN)
Application Number:
PCT/CN2021/128893
Publication Date:
May 11, 2023
Filing Date:
November 05, 2021
Export Citation:
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Assignee:
CONTEMPORARY AMPEREX TECHNOLOGY CO LTD (CN)
International Classes:
G06T7/00
Foreign References:
CN110288566A2019-09-27
CN103499585A2014-01-08
CN113538603A2021-10-22
JP2001077165A2001-03-23
Other References:
See also references of EP 4280153A4
Attorney, Agent or Firm:
CCPIT PATENT AND TRADEMARK LAW OFFICE (CN)
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