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Title:
COMPOSITION OPTIMIZATION DEVICE, COMPOSITION OPTIMIZATION METHOD, AND COMPOSITION OPTIMIZATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/085071
Kind Code:
A1
Abstract:
The present invention efficiently searches for a material composition that corresponds to a target phase fraction. This composition optimization device includes: a prediction unit that inputs a prescribed material composition to a trained model which has been trained by using training data in which the material composition of a material to be learned and the phase fraction at each temperature, within a prescribed temperature range, of the material to be learned are associated with each other, thereby predicting the phase fraction at each temperature, within the prescribed temperature range, of the material having the prescribed material composition; and an update unit that backpropagates an error calculated on the basis of a target phase fraction and the predicted phase fraction, thereby updating the prescribed material composition inputted to the trained model. The process in which the prediction unit predicts the phase fraction on the basis of the updated material composition and the process in which the update unit updates the prescribed material composition by backpropagating the calculated error are repeated until the calculated error satisfies a prescribed condition.

Inventors:
OKANO YU (JP)
KANESHITA TAKESHI (JP)
TAKEMOTO SHIMPEI (JP)
Application Number:
PCT/JP2023/037117
Publication Date:
April 25, 2024
Filing Date:
October 12, 2023
Export Citation:
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Assignee:
RESONAC CORP (JP)
International Classes:
G16C60/00; G06N3/02
Domestic Patent References:
WO2020090617A12020-05-07
WO2021015134A12021-01-28
Other References:
EIMEI OYAMA: "An Iterative System for Solving Inverse Problems by Using Neural Networks", TRANSACTIONS OF THE SOCIETY OF INSTRUMENT AND CONTROL ENGINEERS, vol. 31, no. 3, 1 March 1995 (1995-03-01), pages 391 - 398, XP093161164, DOI: 10.9746/sicetr1965.31.391
Attorney, Agent or Firm:
ITOH, Tadashige et al. (JP)
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