BOARD TESTING APPARATUS AND BOARD TESTING METHOD

WIPO Patent Application WO/2023/042440

A1

Provided are a board testing apparatus and the like that enable improvement of yield and appropriate detection of foreign matter which can cause a functional problem on a printed board. In testing a printed board 1, an image is acquired first. The image includes a component mounting area Ma corresponding to a mounting position of a component with respect to the printed board 1, and covers an area that is to be tested in the printed board 1 and that is larger than the component mounting area Ma. Then, any foreign matter X in the area to be tested is detected on the basis of the acquired image. Further, without immediately determining that the detected foreign matter X is an imperfection, determination as to whether or not the foreign matter is an imperfection is made on the basis of the position relationship of the foreign matter X with respect to the component mounting area Ma. Therefore, even if foreign matter X has been detected, in a case where the foreign matter X cannot be considered to generate a functional problem of the printed board 1 judging from the position relationship with respect to the component mounting area Ma, it is possible to ensure that the foreign matter X is not determined to be an imperfection.

WO/2000/029835	NON-CONTACT TOPOGRAPHICAL ANALYSIS APPARATUS AND METHOD THEREOF
JP2009210519	APPARATUS FOR SUPPORTING VISUAL INSPECTION OF SUBSTRATE
JP2013190309	DEFECT INSPECTION DEVICE

KIKUCHI KAZUYOSHI (JP)

PCT/JP2022/011290

March 23, 2023

March 14, 2022

Click for automatic bibliography generation  

CKD CORP (JP)

G01N21/956

JP2006220426A	2006-08-24
JP2013205071A	2013-10-07
JP2021103152A	2021-07-15
JPH08201044A	1996-08-09
JP2003302354A	2003-10-24

KAWAGUCHI Mitsuo (JP)

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