Title:
BIT BREAKDOWN CONDITION DETERMINING METHOD AND DEVICE
Document Type and Number:
WIPO Patent Application WO/2023/236268
Kind Code:
A1
Abstract:
A bit breakdown condition determining method and device. The method comprises: determining a plurality of first breakdown conditions (S101); breaking down, according to each first breakdown condition, a corresponding first bit respectively, to obtain a first breakdown result of each first breakdown condition, wherein different first breakdown conditions correspond to different first bits (S102); and determining a second breakdown condition from the plurality of first breakdown conditions according to the first breakdown results (S103). Because the second breakdown condition is selected based on the results of breakdown experiments, a good breakdown effect can be achieved.
Inventors:
JIANG XIANGQIAN (CN)
WANG XI (CN)
WANG XI (CN)
Application Number:
PCT/CN2022/101314
Publication Date:
December 14, 2023
Filing Date:
June 24, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C5/02; G11C29/00; H01L29/66
Foreign References:
| US20140071762A1 | 2014-03-13 | |||
| CN101859606A | 2010-10-13 | |||
| DE10063626A1 | 2002-07-18 | |||
| JP2004118896A | 2004-04-15 | |||
| KR20000043832A | 2000-07-15 | |||
| US20070007621A1 | 2007-01-11 | |||
| US20090262563A1 | 2009-10-22 | |||
| US20120250437A1 | 2012-10-04 | |||
| US5990698A | 1999-11-23 |
Attorney, Agent or Firm:
LEADER PATENT & TRADEMARK FIRM (CN)
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