ADHESIVE EXAMINATION MARKER AND ADHESIVE EXAMINATION MARKER SET

WIPO Patent Application WO/2022/230999

A1

Provided is an adhesive examination marker for use in diagnostic imaging using microwaves. This adhesive examination marker comprises an adhesive marker body to be attached to an examination object. The adhesive marker body is configured to be able to display thereon marks for use in scanning of the examination object and deform to follow the shape of the examination object. The adhesive marker body has a dielectric constant of less than or equal to 10 with respect to microwaves having a frequency of 1 GHz.

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NOMURA SAEKO (JP)
SHODA RYO (JP)
TANABE JUNYA (JP)

PCT/JP2022/019435

November 03, 2022

April 28, 2022

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TOPPAN INC (JP)

A61B5/0507; B32B7/025

JP2020168348A

2020-10-15

"Electrical insulating materials - Methods for the determination of the relative permittivity and dielectric dissipation factor", JIS C 2138: 2007
"Plastics - Determination of tensile properties - Part 1: General principles", JIS K 7161-1: 2014 (ISO 527-1
"Plastics - Determination of tensile properties - Part 3: Test conditions for films and sheets", JIS K 7127: 1999 (ISO 527-3
"Plastics - Determination of tensile properties - Part 3: Test conditions for films and sheets", JIS K 7127: 1999 (ISO 527-3: 1995
"Plastics-Determination of tensile properties-Part 1: General principles", JIS K 7161-1: 2014 (ISO 527-1: 2012

ONDA Makoto et al. (JP)

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