Title:
ACOUSTIC WAVE PROBE, ACOUSTIC WAVE MEASUREMENT DEVICE, AND ULTRASONIC DIAGNOSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/005002
Kind Code:
A1
Abstract:
Provided are: an acoustic wave probe comprising a substrate, an intermediate layer arranged on the substrate, and an acoustic lens layer arranged on the intermediate layer, in which the intermediate layer is a layer containing a siloxane compound, the siloxane compound has a constituent unit derived from a hydrolysable silicate compound, the acoustic lens layer is a layer produced by curing a room-temperature-curable silicone, and the room-temperature-curable silicone contains a constituent unit having a phenyl group; an acoustic wave measurement device; and an ultrasonic diagnosis device.
Inventors:
NAKAI YOSHIHIRO (JP)
Application Number:
PCT/JP2023/023757
Publication Date:
January 04, 2024
Filing Date:
June 27, 2023
Export Citation:
Assignee:
FUJIFILM CORP (JP)
International Classes:
A61B8/00; H04R17/00
Domestic Patent References:
| WO2017130890A1 | 2017-08-03 | |||
| WO2020223182A1 | 2020-11-05 | |||
| WO2021065990A1 | 2021-04-08 | |||
| WO2021044823A1 | 2021-03-11 |
Foreign References:
| JP2001040286A | 2001-02-13 | |||
| JP2018004901A | 2018-01-11 | |||
| JP2016025612A | 2016-02-08 | |||
| JP2021142109A | 2021-09-24 | |||
| JP2016040798A | 2016-03-24 |
Attorney, Agent or Firm:
IIDA & PARTNERS et al. (JP)
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