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Title:
非破壊検査装置
Document Type and Number:
Japanese Patent JP7407629
Kind Code:
B2
Abstract:
To provide a non-destructive inspection device that allows for a secure transfer of an object to be inspected though a linear inspection conveyer is adopted.SOLUTION: A non-destructive inspection device comprises: a radiation generator 2 that irradiates an inspected object W with a radiation beam; a radiation detector 3 that is provided facing the radiation generator 2; a linear inspection conveyer 51 that is provided between the radiation generator 2 and the radiation detector 3, and conveys the inspected object W in a state where a plurality of the inspected objects are lined at fixed intervals; and a carry-in device 52 that carries in the inspected object W to a carry-in side of the inspection conveyer 51; a first transfer device 6a that transfers the inspected object W from the carry-in device 52 to the inspection conveyer 51; and a first delivery part 62a that is provided on a lateral side of the inspection conveyer 51 and between the carry-in device 52 and the inspection conveyer 51. In a transfer path of the inspected object W, each loading surface of the inspected object W in the carry-in device 52, the first delivery part 62a and the inspection conveyer 51 is flush with each other on the same plane surface.SELECTED DRAWING: Figure 1

Inventors:
Yukio Someya
Masaharu Shinohara
Hidekazu Hankui
Kohei Nagata
Takayuki Arai
Application Number:
JP2020045216A
Publication Date:
January 04, 2024
Filing Date:
March 16, 2020
Export Citation:
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Assignee:
Toshiba IT Control System Co., Ltd.
International Classes:
G01N23/04; H01G13/00
Domestic Patent References:
JP2017075830A
JP2014048178A
JP2015075400A
Foreign References:
US20170082777
Attorney, Agent or Firm:
Mitsuharu Kiuchi
Koichi Okuma
Sadanori Katagiri
Kanako Kiuchi



 
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