Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
VAPOR PHASE CHEMICAL REACTION ETCHING METHOD AND ITS DEVICE
Document Type and Number:
Japanese Patent JPH0717800
Kind Code:
A
Abstract:

PURPOSE: To provide an etching method to facilitate vapor phase chemical reaction etching of the oxide or nitride of metallic element and its device constitution.

CONSTITUTION: This method comprises using gaseous hydrogen and at least one kind among electron acceptive gases: A (A is hydrocarbons, such as 1 to 3C alkane, alkene or alkyneor materials formed substituting alcohol group, ketone group and the hydrogen of these hydrocarbons with halogen or halogen alone) and eliminating the constituting elements of the material to be etched from the surface of a base material discretely by the effect of the respective reactive gases. The using method comprises mixing the respective reactive gases or discretely exciting these gases with plasma and simultaneously acting the gases on the material to be etched to efficiently obtain a total etching quantity or acting the respective reactive gases discretely excited with the plasma on the material 2 to be etched by shifting the time zones to permit etching with each of the atomic layers.


Inventors:
SUZUKI TAKESHI
MATSUI TOSHIYUKI
KIMURA HIROSHI
KOE KAZUO
OI AKIHIKO
Application Number:
JP16490793A
Publication Date:
January 20, 1995
Filing Date:
July 05, 1993
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
FUJI ELECTRIC CO LTD
International Classes:
B01J19/08; C01G1/00; C01G3/00; C04B41/91; C23F4/00; C30B33/12; H01L21/302; H01L21/3065; (IPC1-7): C30B33/12; B01J19/08; C01G1/00; C01G3/00; C04B41/91; H01L21/3065
Attorney, Agent or Firm:
Iwao Yamaguchi



 
Next Patent: レール軌道構造