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Title:
METHOD AND APPARATUS FOR EXAMINING COMPONENT INSPECTION LINE
Document Type and Number:
Japanese Patent JP2005099360
Kind Code:
A
Abstract:

To provide early correspondence by efficiently monitoring the operating conditions of an inspection line for inspecting components.

Tools for examination are positioned and held on pallets in place of the components and are carried to respective inspection processes. The pallets are provided with memory functions and are made to store identification information to the extent that the components are for examination. The identification information is read by respective inspection machines and the inspection machines are made to alternatively select and carry out an ordinary inspection operation and a examination operation based on the identification information. When the inspection machines carry out the examination operation, the machines judge abnormality or normality based on the results of the examination and display the abnormality to the outside in case of the abnormality. Also, the inspection results in the respective inspection machines are stored in the memory functions and all of the inspection data are read by making the data correspond to the identification information after the end of the inspection and the component inspection line is examined by monitoring the history of the acceptance and rejection of the components by each of the pallets.


Inventors:
OTA HIROYUKI
Application Number:
JP2003332254A
Publication Date:
April 14, 2005
Filing Date:
September 24, 2003
Export Citation:
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Assignee:
FUJI PHOTO FILM CO LTD
International Classes:
G03C3/00; G03B43/00; (IPC1-7): G03B43/00; G03C3/00
Domestic Patent References:
JPH07229839A1995-08-29
JPH0989805A1997-04-04
JPH11326431A1999-11-26
JPH11281695A1999-10-15
Attorney, Agent or Firm:
Kazunori Kobayashi