Title:
TEMPERATURE REGULATING SYSTEM, ABNORMALITY DETERMINING METHOD, AND ABNORMALITY DETERMINING DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/095752
Kind Code:
A1
Abstract:
This temperature regulating system comprises a temperature regulator for controlling a heat treatment temperature of a heat treatment device, and an abnormality determining device for determining an abnormality of the heat treatment device. The abnormality determining device includes: a first acquiring unit capable of acquiring a feature quantity of a control waveform of the heat treatment device when the heat treatment temperature is in a settled state and when the heat treatment device is subjected to a disturbance; and a first determining unit which determines that the heat treatment device is abnormal if the feature quantity acquired by the first acquiring unit exceeds a first threshold.
Inventors:
YAMADA TAKAAKI (JP)
KUNIYASU YUKI (JP)
TSUBATA HAJIME (JP)
MIYAMOTO TAICHI (JP)
OZAKI MASAHIRO (JP)
NISHIDE MIHO (JP)
KUNIYASU YUKI (JP)
TSUBATA HAJIME (JP)
MIYAMOTO TAICHI (JP)
OZAKI MASAHIRO (JP)
NISHIDE MIHO (JP)
Application Number:
PCT/JP2023/037433
Publication Date:
May 10, 2024
Filing Date:
October 16, 2023
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
G05B23/02; G05D23/19
Domestic Patent References:
| WO2022014714A1 | 2022-01-20 |
Foreign References:
| JP2006292535A | 2006-10-26 | |||
| JP2020187686A | 2020-11-19 |
Attorney, Agent or Firm:
YAMAO, Norihito et al. (JP)
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