Title:
SUBSTRATE CLEANING DEVICE AND SUBSTRATE CLEANING METHOD
Document Type and Number:
WIPO Patent Application WO/2024/024474
Kind Code:
A1
Abstract:
This substrate cleaning device comprises: a substrate rotation/retention unit that rotates a substrate while retaining the substrate; a first cleaning brush that has a first cleaning surface inclined so as to allow contact with a first bevel region of the substrate retained by the substrate rotation/retention unit; a first drive unit that is configured so as to shift the first cleaning brush between a first contact state, in which the first cleaning surface is in contact with the first bevel region of the substrate rotated by the substrate rotation/retention unit, and a first separated state, in which the first cleaning surface is separated from the first bevel region of the substrate rotated by the substrate rotation/retention unit; and a control unit that controls the first drive unit so that, if a first condition determined in advance has been met, the position of contact of the first cleaning surface with the first bevel region in the first contact state is changed.
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Inventors:
TANAKA KATSUNORI (JP)
HOKAKU RYOHEI (JP)
YANO WATARU (JP)
HOKAKU RYOHEI (JP)
YANO WATARU (JP)
Application Number:
PCT/JP2023/025415
Publication Date:
February 01, 2024
Filing Date:
July 10, 2023
Export Citation:
Assignee:
SCREEN HOLDINGS CO LTD (JP)
International Classes:
H01L21/304; B08B3/02
Foreign References:
JP2007273607A | 2007-10-18 | |||
JP2009123764A | 2009-06-04 | |||
JPH10242092A | 1998-09-11 | |||
JP2009032889A | 2009-02-12 | |||
JP2011211246A | 2011-10-20 | |||
JP2003031541A | 2003-01-31 |
Attorney, Agent or Firm:
NAKAGAWA, Masahiro et al. (JP)
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