Title:
SOLID-STATE IMAGING DEVICE, AND COMPARISON DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/075492
Kind Code:
A1
Abstract:
[Problem] To perform fast and high-performance signal comparison. [Solution] This solid-state imaging device comprises a comparison circuit, a first switch, a second switch, a third switch, a first capacitor, and a second capacitor. The comparison circuit is provided with a non-inverting input terminal and an inverting input terminal. The first switch is connected to the inverting input terminal. The second switch is connected to the inverting input terminal and is controlled at a different timing than the first switch. The third switch is connected between an output terminal of the comparison circuit and the inverting input terminal. One end of the first capacitor is connected to the inverting input terminal via the first switch, and a reference signal is applied to the other end of the first capacitor. One end of the second capacitor is connected to the inverting input terminal via the second switch, and the reference signal is applied to the other end of the second capacitor.
Inventors:
AZUHATA SATOSHI (JP)
Application Number:
PCT/JP2023/033578
Publication Date:
April 11, 2024
Filing Date:
September 14, 2023
Export Citation:
Assignee:
SONY SEMICONDUCTOR SOLUTIONS CORP (JP)
International Classes:
H04N25/77; H04N25/772
Domestic Patent References:
| WO2015019836A1 | 2015-02-12 |
Foreign References:
| JP2020120310A | 2020-08-06 | |||
| JP2013065970A | 2013-04-11 |
Attorney, Agent or Firm:
MIYAJIMA Manabu (JP)
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