Title:
OPTICAL MEASUREMENT APPARATUS INCLUDING UNIVERSAL METASURFACE, AND OPTICAL MEASUREMENT METHOD USING SAME
Document Type and Number:
WIPO Patent Application WO/2022/173240
Kind Code:
A2
Abstract:
An optical measurement apparatus, according to one aspect of the present invention, comprises: a universal metasurface on which light is incident; a polarizations sensor which measures the polarization state of light passing through the universal metasurface; and a control unit which collects a quantitative differential interference contrast (QDIC) image for x polarization and a QDIC image for y polarization of the incident light collected by the polarization sensor, and a quantitative relative phase (QRP) image indicating the relative phase difference between the x polarization and the y polarization, and calculates the intensity, phase, or polarization information about the incident light.
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Inventors:
SHIN JONGHWA (KR)
CHANG TAEYONG (KR)
JUNG JOONKYO (KR)
CHANG TAEYONG (KR)
JUNG JOONKYO (KR)
Application Number:
PCT/KR2022/002033
Publication Date:
August 18, 2022
Filing Date:
February 10, 2022
Export Citation:
Assignee:
KOREA ADVANCED INST SCI & TECH (KR)
International Classes:
G01J1/04; G01B9/02; G01J4/00; G01J9/02; G02B21/00
Attorney, Agent or Firm:
MAPS INTELLECTUAL PROPERTY LAW FIRM (KR)
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