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Patent Searching and Data


Title:
METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE AND RESIST UNDERLAYER FILM-FORMING COMPOSITION
Document Type and Number:
WIPO Patent Application WO/2023/068075
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide: a method for producing a semiconductor substrate, the method using a resist underlayer film-forming composition from which it is possible to form a resist underlayer film that has excellent solvent resistance and excellent resist pattern rectangularity; and a resist underlayer film-forming composition. The method for producing a semiconductor substrate comprises: a step for directly or indirectly applying a resist underlayer film-forming composition to a substrate; a step for applying a resist film-forming composition to a resist underlayer film that is formed in the step for applying the resist underlayer film-forming composition; a step for exposing, to radiation, a resist film that is formed in the step for applying the resist film-forming composition; and a step for developing at least the exposed resist film. The resist underlayer film-forming composition contains a polymer that has a partial structure represented by formula (i), and a solvent. (In formula (i), Y1 represents a divalent group selected from the group consisting of a sulfonyl group, a carbonyl group, and an alkanediyl group. Y2 represents a divalent group selected from the group consisting of a sulfonyl group, a carbonyl group, and a single bond. Note that in the case where Y1 represents an alkanediyl group, Y2 represents a sulfonyl group or a carbonyl group. In the case where Y2 represents a single bond, Y1 represents a sulfonyl group or a carbonyl group. R1 represents a monovalent organic group having 1-20 carbon atoms. X+ represents a monovalent onium cation.* represents a bond between the polymer and another structure.)

Inventors:
DOBASHI MASATO (JP)
KOMATSU HIROYUKI (JP)
YONEDA EIJI (JP)
DEI SATOSHI (JP)
EHARA KENGO (JP)
YOSHINAKA SHO (JP)
KATAGIRI TAKASHI (JP)
Application Number:
PCT/JP2022/037579
Publication Date:
April 27, 2023
Filing Date:
October 07, 2022
Export Citation:
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Assignee:
JSR CORP (JP)
International Classes:
G03F7/11; C08F12/30; G03F7/039
Domestic Patent References:
WO2011018928A12011-02-17
Foreign References:
JP2011164345A2011-08-25
JP2013007892A2013-01-10
JP2016047920A2016-04-07
JP2013148787A2013-08-01
Attorney, Agent or Firm:
UNIUS PATENT ATTORNEYS OFFICE (JP)
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