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Patent Searching and Data


Title:
METHOD FOR PRODUCING SEMICONDUCTOR SUBSTRATE, COMPOSITION, POLYMER AND METHOD FOR PRODUCING POLYMER
Document Type and Number:
WIPO Patent Application WO/2022/191062
Kind Code:
A1
Abstract:
The purpose of the present invention is to provide: a method for producing a semiconductor substrate, the method using a composition which is capable of forming a film that exhibits excellent etching resistance, heat resistance and bending resistance; a composition; a polymer; and a method for producing a polymer. A method for producing a semiconductor substrate, the method comprising: a step in which a composition for forming a resist underlayer film is directly or indirectly applied to a substrate; a step in which a resist pattern is directly or indirectly formed on a resist under layer film that is formed in the application step; and a step in which etching is carried out using the resist pattern as a mask. With respect to this method for producing a semiconductor substrate, the composition for forming a resist underlayer film contains a solvent and a polymer which has a repeating unit represented by formula (1). (In formula (1), Ar1 represents a divalent group having an aromatic ring that has 10 to 40 ring members; and R0 represents a heteroaromatic ring that contains a sulfur atom as a ring-forming atom.)

Inventors:
NAKATSU HIROKI (JP)
YAMADA SHUHEI (JP)
ABE SHINYA (JP)
TSUJI TAKASHI (JP)
UEDA KANAKO (JP)
MIYAUCHI HIROYUKI (JP)
Application Number:
PCT/JP2022/009373
Publication Date:
September 15, 2022
Filing Date:
March 04, 2022
Export Citation:
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Assignee:
JSR CORP (JP)
International Classes:
C08G8/04; C08G12/26; G03F7/11; G03F7/20; G03F7/26
Foreign References:
KR20190053546A2019-05-20
Attorney, Agent or Firm:
UNIUS PATENT ATTORNEYS OFFICE (JP)
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