Title:
MEASUREMENT SYSTEM AND MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2024/095352
Kind Code:
A1
Abstract:
Provided is a measurement system comprising a scanner which emits guide light from a predetermined emission position toward a target, a first sensor which receives the guide light reflected on the target, and a calculation unit which calculates a distance between the scanner and the target on the basis of information relating to the guide light from the first sensor.
Inventors:
GUO LEI (JP)
Application Number:
PCT/JP2022/040831
Publication Date:
May 10, 2024
Filing Date:
October 31, 2022
Export Citation:
Assignee:
FANUC CORP (JP)
International Classes:
G01C3/06; G01B11/00
Foreign References:
| JP2018176245A | 2018-11-15 | |||
| JP2015152585A | 2015-08-24 | |||
| JPS6316892A | 1988-01-23 | |||
| JP2020175409A | 2020-10-29 |
Attorney, Agent or Firm:
AIWA INTERNATIONAL PATENT AGENCY (JP)
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