Title:
MAGNETIC SUSCEPTIBILITY MEASUREMENT DEVICE AND MAGNETIC SUSCEPTIBILITY MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2024/095616
Kind Code:
A1
Abstract:
This magnetic susceptibility measurement device measures the magnetic susceptibility of a magnetic particle-containing object to be measured (1), and comprises: a probe (10) with which a signal transmission line is formed, wherein the object to be measured is disposed in proximity to or in contact with the signal transmission line such that the direction of an axis of easy magnetization of the object to be measured assumes a direction orthogonal to the signal transmission line; a first magnetic field application unit (40) for applying a magnetic field in the direction of the axis of easy magnetization of the object to be measured; a second magnetic field application unit (50) for applying a magnetic field in the direction of an axis of hard magnetization that is orthogonal to the direction of the axis of easy magnetization of the object to be measured; a signal measurement instrument (20) that measures the signal transmitted by the signal transmission line when a magnetic field is being applied by both the first magnetic field application unit and the second magnetic field application unit; and a calculation processing means (30) that determines the magnetic susceptibility of the object to be measured on the basis of the signal measured by the signal measurement instrument.
Inventors:
YABUKAMI SHIN (JP)
OKITA KAZUHIKO (JP)
MURAYAMA TORU (JP)
OKITA KAZUHIKO (JP)
MURAYAMA TORU (JP)
Application Number:
PCT/JP2023/033188
Publication Date:
May 10, 2024
Filing Date:
September 12, 2023
Export Citation:
Assignee:
UNIV TOHOKU (JP)
International Classes:
G01N27/72; G01N33/483; G01R33/16
Attorney, Agent or Firm:
FIELDS IP ATTORNEYS PPC (JP)
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