Title:
FREQUENCY RESPONSE MEASUREMENT SYSTEM BASED ON HARMONIC WAVE, AND METHOD
Document Type and Number:
WIPO Patent Application WO/2023/005248
Kind Code:
A1
Abstract:
A frequency response measurement system based on a harmonic wave. A square wave having a duty cycle of 50% is used as a measurement signal, the oversampling rate of an analog-to-digital converter in the measurement system is set to be a half integer, and frequency responses, on multiple frequency points, of a linear system to be measured are obtained by means of one mathematical operation. Further disclosed is a method for performing frequency response measurement using the frequency response measurement system based on the harmonic wave. The measurement system and method have the advantages of high measurement efficiency and low measurement cost.
Inventors:
FENG XIANGDONG (CN)
ZHAO BO (CN)
ZHAO BO (CN)
Application Number:
PCT/CN2022/083899
Publication Date:
February 02, 2023
Filing Date:
March 30, 2022
Export Citation:
Assignee:
UNIV ZHEJIANG (CN)
International Classes:
G01D18/00
Foreign References:
| CN113624269A | 2021-11-09 | |||
| CN101034130A | 2007-09-12 | |||
| CN110297126A | 2019-10-01 | |||
| US20180180652A1 | 2018-06-28 | |||
| CN203772956U | 2014-08-13 | |||
| JPH10260066A | 1998-09-29 |
Attorney, Agent or Firm:
HANGZHOU ZHEKE PATENT AGENCY (GENERAL PARTNERSHIP) (CN)
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