FPGA STORAGE UNIT FAILURE ANALYSIS METHOD AND APPARATUS, ELECTRONIC DEVICE, AND STORAGE MEDIUM

WIPO Patent Application WO/2024/082812

A1

The present application relates to the field of semiconductor device testing, and discloses an FPGA storage unit failure analysis method and apparatus, an electronic device, and a storage medium. The FPGA storage unit failure analysis method provided by the present application comprises: exciting all the storage units, so that the level of a failed storage unit in the storage units is flipped; and detecting the failed storage unit according to a single event upset detection function of a single event upset detection module. According to the FPGA storage unit failure analysis method provided by the present application, the single event upset detection module is applied to failure analysis of an FPGA storage unit, and rapid failure analysis is carried out on the FPGA storage unit by using the single event upset detection principle, so that some weak failures and early failures that are not easy to find can be effectively tested. Moreover, the method is not only applied to ex-factory test of the FPGA, but also can be applied to a user terminal of the FPGA, can also be applied to analysis and verification of a failed FPGA in a laboratory, and has universality, operability, and flexibility.

HUANG SHIJUN (CN)
BAO CHAOWEI (CN)
ZHANG XUHUA (CN)

PCT/CN2023/114704

April 25, 2024

August 24, 2023

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SHENZHEN PANGO MICROSYSTEMS CO LTD (CN)

G11C29/44; G11C29/14; G11C29/42

SHENZHEN CHINA INNOVATION SOUTH INTELLECTUAL PROPERTY AGENCY CO., LTD. (CN)

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