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Patent Searching and Data


Title:
ELECTRICAL DEVICE TEMPERATURE MEASUREMENT METHOD AND APPARATUS, STORAGE MEDIUM, AND COMPUTER DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/051431
Kind Code:
A1
Abstract:
An electrical device temperature measurement method and apparatus, a storage medium, and a computer device. The method comprises: photographing an infrared image of an electrical device by means of an infrared binocular camera, and performing infrared temperature measurement on an area within a field of view of the infrared binocular camera to obtain temperature measurement information (S101); performing triangulation calculation on the infrared image to determine depth information corresponding to the infrared image (S102); cutting the infrared image according to the depth information to obtain a target image within a preset depth range (S103); identifying a target device image in the target image, and outputting target device temperature information according to the temperature measurement information (S104).

Inventors:
ZHANG NA (CN)
YANG GANG (CN)
HU FAN (CN)
WANG DAWEI (CN)
YU HUA (CN)
LI XIAOQIAN (CN)
ZHANG YUAN (CN)
Application Number:
PCT/CN2023/111944
Publication Date:
March 14, 2024
Filing Date:
August 09, 2023
Export Citation:
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Assignee:
STATE GRID SHANXI ELECTRIC POWER RES INSTITUTE (CN)
International Classes:
G01J5/00; G06T7/00
Domestic Patent References:
WO2021196360A12021-10-07
Foreign References:
CN115183876A2022-10-14
CN113418617A2021-09-21
CN101625762A2010-01-13
US20130235163A12013-09-12
CN108596128A2018-09-28
CN113820020A2021-12-21
Attorney, Agent or Firm:
BEYOND ATTORNEYS AT LAW (CN)
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